中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system

文献类型:期刊论文

作者Chen SL(陈松林); Xia RB(夏仁波); Zhao JB(赵吉宾); Zhang HY(张洪瑶); Hu MB(胡茂邦)
刊名Optical Engineering
出版日期2017
卷号56期号:3页码:1-9
关键词three-dimensional measurement structured light phase shifting phase error analysis phase error reduction
ISSN号0091-3286
产权排序1
通讯作者夏仁波
中文摘要The measurement accuracy of a phase-shifting measurement system is adversely affected by phase errors. This paper presents a theoretical analysis of phase errors caused by nonuniform surface reflectivity, such as varying reflectivity and a sharp change in reflectivity. Based on the analysis, a method to adaptively adjust the maximum input gray level of each pixel in projected fringe patterns to the local reflectivity was proposed to reduce phase errors. Experimental results for a planar checkerboard show that the measurement error can be reduced by 56.6% by using the proposed method.
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
关键词[WOS]HIGH DYNAMIC-RANGE ; 3-DIMENSIONAL SHAPE MEASUREMENT ; DIGITAL FRINGE PROJECTION ; SATURATION AVOIDANCE ; PROFILOMETRY ; POLARIZATION ; OBJECTS
收录类别SCI ; EI
语种英语
WOS记录号WOS:000397207200026
源URL[http://ir.sia.cn/handle/173321/20209]  
专题沈阳自动化研究所_装备制造技术研究室
推荐引用方式
GB/T 7714
Chen SL,Xia RB,Zhao JB,et al. Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system[J]. Optical Engineering,2017,56(3):1-9.
APA Chen SL,Xia RB,Zhao JB,Zhang HY,&Hu MB.(2017).Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system.Optical Engineering,56(3),1-9.
MLA Chen SL,et al."Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system".Optical Engineering 56.3(2017):1-9.

入库方式: OAI收割

来源:沈阳自动化研究所

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