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Characteristics Analysis for Nanosoldering with Atomic Force Microscope

文献类型：期刊论文

作者Jiao ND(焦念东); Liu LQ(刘连庆); Xie SX(解双喜); Gao AL(高爱莲); Liu ZL(刘增磊); Li S(李帅); Pan FC(潘福成)
刊名Nano
出版日期2018
卷号13期号:4页码:1-8
关键词Field-emission deposition nanosoldering nanodevice nanofabrication
ISSN号1793-2920
产权排序4
通讯作者Liu ZL(刘增磊)
中文摘要Field-emission deposition of atomic force microscope (AFM) can be used to fabricate nanopads, and therefore has potential applications in soldering nanodevices. However, the soldering effects are hard to verify because the soldering pads are of nanoscale. This paper studied the electrical, thermal and mechanical characteristics of the deposited nanopads, in order to testify the soldering effects. For this purpose, first, a carbon nanotube field effect transistor (CNTFET) was soldered to see whether the conductivity of the transistor was improved. Next, the thermal performance of the nanopads were observed by heating them in an oven. Last, the nanopads were mechanically pushed by an AFM probe to test the physical connection between the nanopads and the substrate. Experimental results showed that the nanosoldering dramatically reduced the contact resistance of the transistor. Moreover, the nanopads could withstand high temperature and mechanical push. Consequently, field-emission deposition of the AFM promised a bright future in nanosoldering.
WOS标题词Science & Technology ; Technology ; Physical Sciences
类目[WOS]Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
研究领域[WOS]Science & Technology - Other Topics ; Materials Science ; Physics
收录类别SCI ; EI
语种英语
WOS记录号WOS:000431138000007
源URL[http://ir.sia.cn/handle/173321/21862]  
专题沈阳自动化研究所_数字工厂研究室
作者单位1.School of Electronic and Electrical Engineering, Nanyang Institute of Technology, Nanyang 473004, P. R. China
2.Information Construction and Network Center, Nanyang Institute of Technology, Nanyang 473004, P. R. China
3.College of Electrical and Mechanical Engineering, Pingdingshan University, Pingdingshan 467000, P. R. China
4.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, P. R. China
推荐引用方式
GB/T 7714		 Jiao ND,Liu LQ,Xie SX,et al. Characteristics Analysis for Nanosoldering with Atomic Force Microscope[J]. Nano,2018,13(4):1-8.
APA Jiao ND.,Liu LQ.,Xie SX.,Gao AL.,Liu ZL.,...&潘福成.(2018).Characteristics Analysis for Nanosoldering with Atomic Force Microscope.Nano,13(4),1-8.
MLA Jiao ND,et al."Characteristics Analysis for Nanosoldering with Atomic Force Microscope".Nano 13.4(2018):1-8.

入库方式： OAI收割

来源：沈阳自动化研究所

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