中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Research on the atomic force microscopy-based fabrication of nanochannels on silicon oxide surfaces

文献类型:期刊论文

作者Wang ZQ(王志迁); Jiao ND(焦念东); TUNG Steve; Dong ZL(董再励)
刊名Chinese Science Bulletin
出版日期2010
卷号55期号:30页码:3466–3471
关键词atomic force microscopy nanochannels nanoelectromechanical systems nanolithography nanotribology
ISSN号1001-6538
产权排序1
中文摘要The atomic force microscopy (AFM)-based nanomachining of nanochannels on silicon oxide surfaces is investigated both theoretically and experimentally. The relationships of nanochannel depth versus cutting velocity, nanochannel depth versus normal force, friction force versus cutting velocity, and friction force versus normal force are systematically studied. Using the derived theory and fabrication method, a nanochannel with an expected depth can be machined simply by controlling the vertical deflection signal on the position sensitive detector of AFM. The theoretical analysis and fabrication method can be effectively used for AFM-based fabrication of nanochannels.
WOS标题词Science & Technology
类目[WOS]Multidisciplinary Sciences
研究领域[WOS]Science & Technology - Other Topics
关键词[WOS]NANOFLUIDIC CHANNELS ; MICROFLUIDIC DEVICE ; CELLS ; AFM ; NANOMANIPULATION ; SYSTEMS ; MANIPULATION ; FLOW
收录类别SCI
语种英语
WOS记录号WOS:000284064700012
公开日期2012-05-29
源URL[http://ir.sia.cn/handle/173321/7399]  
专题沈阳自动化研究所_机器人学研究室
推荐引用方式
GB/T 7714
Wang ZQ,Jiao ND,TUNG Steve,et al. Research on the atomic force microscopy-based fabrication of nanochannels on silicon oxide surfaces[J]. Chinese Science Bulletin,2010,55(30):3466–3471.
APA Wang ZQ,Jiao ND,TUNG Steve,&Dong ZL.(2010).Research on the atomic force microscopy-based fabrication of nanochannels on silicon oxide surfaces.Chinese Science Bulletin,55(30),3466–3471.
MLA Wang ZQ,et al."Research on the atomic force microscopy-based fabrication of nanochannels on silicon oxide surfaces".Chinese Science Bulletin 55.30(2010):3466–3471.

入库方式: OAI收割

来源:沈阳自动化研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。