Nanoscale Welding by AFM Tip Induced Electric Field
文献类型:会议论文
作者 | Yu HB(于海波)![]() ![]() ![]() ![]() ![]() ![]() |
出版日期 | 2009 |
会议名称 | 4th IEEE International Conference of Nano/Micro Engineered and Molecular Systems |
会议日期 | January 5-8, 2009 |
会议地点 | Shenzhen, China |
关键词 | AFM DEP Nanodevices Nano-welding SWCNTs |
页码 | 116-120 |
中文摘要 | The most difficult challenges in fabricating SWCNT-based nanosystems or nanodevices have proven to be the assembly and anchoring of SWCNTs to form a stable physical and electric contact between SWCNTs and the electrodes. For example, for SWCNT-based nanosensors or field effect transistors (FETs), the need to fix the SWCNT between electrodes is extremely important, Le., it affects the electronic transport properties at the connection point Currently, researchers usually focus on the assembly between SWCNTs and the electrodes by using dielectrophoresis (DEP), direct growth, or atomic force microscopy (AFM). In this paper, we present a new method to realize nanoscale welding by using an AFM tip coated with conductive materials. This method is very useful in welding the SWCNTs on the micro electrodes after the manipulation of the SWCNTs in between the microclectrodes by AFM-based or DEP-based manipulation. In our experiments, we first assembled individual SWCNTs or bundles of SWCNTs between two electrodes using DEP force. Then, SWCNTs are welded on the surface of the electrodes when a bins impulse voltage is exerted between the AFM tip and sample, which produces an electric field. The experimental results have demonstrated that SWCNTs can effectively be welded on the surface of the electrodes. |
收录类别 | EI ; CPCI(ISTP) |
产权排序 | 1 |
会议主办者 | IEEE |
会议录 | 2009 4TH IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1 AND 2
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会议录出版者 | IEEE |
会议录出版地 | NEW YORK |
语种 | 英语 |
ISBN号 | 978-1-4244-4629-2 |
WOS记录号 | WOS:000273161500027 |
源URL | [http://ir.sia.cn/handle/173321/8800] ![]() |
专题 | 沈阳自动化研究所_机器人学研究室 |
推荐引用方式 GB/T 7714 | Yu HB,Jiao ND,Dong ZL,et al. Nanoscale Welding by AFM Tip Induced Electric Field[C]. 见:4th IEEE International Conference of Nano/Micro Engineered and Molecular Systems. Shenzhen, China. January 5-8, 2009. |
入库方式: OAI收割
来源:沈阳自动化研究所
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