Automated Pose Measurement Method Based on Multivision and Sensor Collaboration for Slice Microdevice
文献类型：期刊论文
| 作者 | Shen, Fei1,4 ; Qin, Fangbo1,4; Zhang, Zhengtao1,4; Xu, De1,4; Zhang, Juan2,3; Wu, Wenrong2,3
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| 刊名 | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
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| 出版日期 | 2021 |
| 卷号 | 68期号:1页码:488-498 |
| ISSN号 | 0278-0046 |
| 关键词 | Image feature extraction microassembly multimicroscopic vision control pose measurement slice microdevice |
| DOI | 10.1109/TIE.2020.2965472 |
| 通讯作者 | Zhang, Zhengtao(zhengtao.zhang@ia.ac.cn) |
| 英文摘要 | In this article, an automated method based on the multivision and sensor collaboration is proposed to achieve the precision pose measurement of microdevice with a slice micropart embedded inside. This method consists of three modules. First, the invisible attitude component measurement module based on a laser range sensor and the top view is designed to acquire the initial attitude component determined by the inside slice micropart. Second, the attitude component measurement module based on the contour primitives of interest extraction method abbreviated as contour primitives of interest extraction (CPIE) is utilized to obtain the other attitude components by extracting features from images directly. Third, an attitude controller based on the multivision is presented to achieve automated attitude component restriction ensuring that an exact attitude can be obtained when occlusion occurred. A series of experiments including entire assembly experiments are conducted and experimental results reveal that the proposed methods are effective and the attitude error is less than 0.6 degrees meeting the requirement of assembly. |
| 资助项目 | National Key Research and Development Program of China[2017YFB1302303] ; National Natural Science Foundation of China[61873266] ; National Natural Science Foundation of China[61503378] ; Youth Innovation Promotion Association, Chinese Academy of Sciences |
| WOS研究方向 | Automation & Control Systems ; Engineering ; Instruments & Instrumentation |
| 语种 | 英语 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| WOS记录号 | WOS:000584255900044 |
| 资助机构 | National Key Research and Development Program of China ; National Natural Science Foundation of China ; Youth Innovation Promotion Association, Chinese Academy of Sciences |
| 源URL | [http://ir.ia.ac.cn/handle/173211/41671]  |
| 专题 | 精密感知与控制研究中心_精密感知与控制 |
| 通讯作者 | Zhang, Zhengtao |
| 作者单位 | 1.Univ Chinese Acad Sci, Sch Artificial Intelligence, Beijing 100049, Peoples R China 2.China Acad Engn Phys, Lab Precis Mfg Technol, Mianyang 621900, Sichuan, Peoples R China 3.China Acad Engn Phys, Laser Fus Res Ctr, Mianyang 621900, Sichuan, Peoples R China 4.Chinese Acad Sci, Inst Automat, Res Ctr Precis Sensing & Control, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Shen, Fei,Qin, Fangbo,Zhang, Zhengtao,et al. Automated Pose Measurement Method Based on Multivision and Sensor Collaboration for Slice Microdevice[J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS,2021,68(1):488-498. |
| APA | Shen, Fei,Qin, Fangbo,Zhang, Zhengtao,Xu, De,Zhang, Juan,&Wu, Wenrong.(2021).Automated Pose Measurement Method Based on Multivision and Sensor Collaboration for Slice Microdevice.IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS,68(1),488-498. |
| MLA | Shen, Fei,et al."Automated Pose Measurement Method Based on Multivision and Sensor Collaboration for Slice Microdevice".IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS 68.1(2021):488-498. |
入库方式： OAI收割
来源：自动化研究所
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