中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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  • 2001 [3]
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  • 半导体材料 [3]
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Effects of annealing time and Si cap layer thickness on the Si/SiGe/Si heterostructures thermal stability 期刊论文  OAI收割
journal of crystal growth, 2001, 卷号: 227, 期号: 0, 页码: 766-769
Gao F; Lin YX; Huang DD; Li JP; Sun DZ; Kong MY; Zeng YP; Li JM; Lin LY
收藏  |  浏览/下载:97/14  |  提交时间:2010/08/12
Effects of annealing time and Si cap layer thickness on the Si/SiGe/Si heterostructures thermal stability 会议论文  OAI收割
11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000
Gao F; Lin YX; Huang DD; Li JP; Sun DZ; Kong MY; Zeng YP; Li JM; Lin LY
收藏  |  浏览/下载:8/0  |  提交时间:2010/11/15
Competition between band gap and yellow luminescence in undoped GaN grown by MOVPE on sapphire substrate 期刊论文  OAI收割
journal of crystal growth, 2001, 卷号: 222, 期号: 1-2, 页码: 96-103
Xu HZ; Bell A; Wang ZG; Okada Y; Kawabe M; Harrison I; Foxon CT
收藏  |  浏览/下载:53/0  |  提交时间:2010/08/12