机构

• 高能物理研究所 [2]
• 长春光学精密机械与物... [1]
• 化学研究所 [1]
• 大连化学物理研究所 [1]

采集方式

• OAI收割 [4]
• iSwitch采集 [1]

内容类型

• 期刊论文 [4]
• 会议论文 [1]

发表日期

• 2017 [2]
• 2010 [1]
• 2008 [1]
• 2005 [1]

学科主题

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Mcp performance improvement using alumina thin film 期刊论文  iSwitch采集 Nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 2017, 卷号: 868, 页码: 43-47 作者:  Yang, Yuzhen;  Yan, Baojun;  Liu, Shulin;  Zhao, Tianchi;  Yu, Yang 收藏  |  浏览/下载：37/0  |  提交时间：2019/04/23 Dual mcp assembly  Alumina thin film  Atomic layer deposition  Single electron counting   MCP performance improvement using alumina thin film 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2017, 卷号: 868, 页码: 43-47 作者:  Wen, KL;  Yu, Y;  Liu, SL;  Zhao, TC;  Yan, BJ   |  收藏  |  浏览/下载：24/0  |  提交时间：2019/08/27 Dual MCP assembly  Alumina thin film  Atomic layer deposition  Single electron counting   Organic floating-gate transistor memory based on the structure of pentacene/nanoparticle-Al/Al2O3 期刊论文  OAI收割 APPLIED PHYSICS LETTERS, 2010, 卷号: 96, 期号: 20 作者:  Wang, Wei;  Ma, Dongge   |  收藏  |  浏览/下载：19/0  |  提交时间：2019/04/09 Alumina  Aluminium  Nanoparticles  Organic Field Effect Transistors  Organic Semiconductors  Semiconductor Storage  Thin Film Transistors  Tunnelling   Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Yang H.;  Liu L.;  Liu L. 收藏  |  浏览/下载：27/0  |  提交时间：2013/03/25 Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.   Reversible regeneration of molybdenum carbonyl species on an alumina thin film 期刊论文  OAI收割 chinese journal of catalysis, 2005, 卷号: 26, 期号: 5, 页码: 423-427 作者:  Jiang, ZQ;  Zhao, H;  Tan, DL;  Zhai, RS;  Bao, XH 收藏  |  浏览/下载：27/0  |  提交时间：2010/11/30 thermal desorption spectroscopy  X-ray photoelectron spectroscopy  molybdenum carbonyl  alumina thin film  reversible regeneration