机构

• 新疆理化技术研究所 [2]
• 光电技术研究所 [1]
• 沈阳自动化研究所 [1]

采集方式

• OAI收割 [4]

内容类型

• 期刊论文 [3]
• 会议论文 [1]

发表日期

• 2021 [1]
• 2020 [1]
• 2011 [1]
• 2010 [1]

学科主题

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文  OAI收割 CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184 作者:  Liu, BK (Liu Bingkai)[ 1,2,3 ];  Li, YD (Li Yudong)[ 1,2 ];  Wen, L (Wen Lin)[ 1,2 ];  Zhou, D (Zhou Dong)[ 1,2 ];  Feng, J (Feng Jie)[ 1,2 ]   |  收藏  |   Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors 期刊论文  OAI收割 RESULTS IN PHYSICS, 2020, 卷号: 19, 期号: 12, 页码: 1-7 作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ]   |  收藏  |   Experimental analysis of solid immersion interference lithography based on backside exposure technique 期刊论文  OAI收割 MICROELECTRONIC ENGINEERING, 2011, 卷号: 88, 期号: 8, 页码: 2509-2512 作者:  Li, Xupeng;  Shi, Sha;  Zhang, Zhiyou;  Wang, Jingquan;  Li, Shuhong 收藏  |   On-Line Visual Inspection System for Backside Weld of Tailored Blanks Laser Welding 会议论文  OAI收割 2nd IEEE International Conference on Advanced Computer Control, Shenyang, China, March 27-29, 2010 作者:  Xu M(许敏);  Zhao MY(赵明扬);  Zou YY(邹媛媛) 收藏  |