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浏览/检索结果: 共13条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择发表日期升序发表日期降序题名升序题名降序提交时间升序提交时间降序作者升序作者降序 Systematic Methodology of Modeling and Design Space Exploration for CMOS Image Sensors 期刊论文  OAI收割 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2026, 卷号: 45, 期号: 2, 页码: 1047-1060 作者:  Ma, Tianrui;  Gao, Zhe;  Chen, Zhe;  Kakarala, Ramakrishna;  Shan, Charles   |  收藏  |  浏览/下载：2/0  |  提交时间：2026/05/25 CMOS image sensors (CIS)  design space explo ration (DSE)  integrated circuit modeling  integrated circuit modeling   Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文  OAI收割 CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184 作者:  Liu, BK (Liu Bingkai)[ 1,2,3 ];  Li, YD (Li Yudong)[ 1,2 ];  Wen, L (Wen Lin)[ 1,2 ];  Zhou, D (Zhou Dong)[ 1,2 ];  Feng, J (Feng Jie)[ 1,2 ]   |  收藏  |  浏览/下载：76/0  |  提交时间：2021/05/10 Backside‐  illuminated CMOS image sensors  Dark signal behaviors  Displacement damage effects  Neutron irradiation   Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 8, 页码: 1861-1868 作者:  Cai, YL (Cai, Yulong)[ 1,2 ];  Wen, L (Wen, Lin)[ 3 ];  Li, YD (Li, Yudong)[ 3 ];  Guo, Q (Guo, Qi)[ 3 ];  Zhou, D (Zhou, Dong)[ 3 ]   |  收藏  |  浏览/下载：50/0  |  提交时间：2020/09/09 Complementary metal-oxide-semiconductor  (CMOS) image sensors (CIS)  heavy ions  pulsed laser  single-event latchup (SEL)  single-event transient (SET)   High-frame frequency imaging system of large area CMOS image sensor 期刊论文  OAI收割 Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2019, 卷号: 27, 期号: 5, 页码: 1167-1177 作者:  Y.-H.Ning;  H.Liu;  Q.-L.Zhao;  H.-Z.Guo   |  收藏  |  浏览/下载：53/0  |  提交时间：2020/08/24 CMOS integrated circuits,Digital cameras,Dynamic random access storage,Image enhancement,Image sensors,Imaging systems,Median filters,Personnel training,Pixels,Signal to noise ratio,Specifications   Study on the key technologies of a high-speed CMOS camera 期刊论文  OAI收割 optik, 2017, 卷号: 129, 页码: 100-107 作者:  Jiang, Baotan;  Pan, Zhibin;  Qiu, Yuehong 收藏  |  浏览/下载：92/0  |  提交时间：2016/11/14 Alignment  Cameras  CMOS integrated circuits  Dynamic random access storage  Field programmable gate arrays (FPGA)  Image sensors  Reconfigurable hardware  Remote sensing  Speed   Performance test and image correction of CMOS image sensor in radiation environment 期刊论文  OAI收割 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96841H 作者:  Wang, Congzheng;  Hu, Song;  Gao, Chunming;  Feng, Chang   |  收藏  |  浏览/下载：45/0  |  提交时间：2018/06/14 Cmos Integrated Circuits  Digital Cameras  Digital Storage  Equipment  Gamma Rays  Image Reconstruction  Image Sensors  Ionizing Radiation  Manufacture  Optical Data Processing  Optical Testing  Pixels  Radiation  Signal To Noise Ratio   A high-speed CMOS image sensor for real-time vision chip 期刊论文  OAI收割 guangxue xuebao/acta optica sinica, Guangxue Xuebao/Acta Optica Sinica, 2011, 2011, 卷号: 31, 31, 期号: 8, 页码: 828001, 828001 作者:  Fu, Qiuyu;  Lin, Qingyu;  Zhang, Wancheng;  Wu, Nanjian;  Fu, Q.(qiuyufu@semi.ac.cn)   |  收藏  |  浏览/下载：85/0  |  提交时间：2012/06/14 Analog to digital conversion  CMOS integrated circuits  Differential amplifiers  Digital cameras  Image sensors  Optical data processing  Photodiodes  Pixels  Programmed control systems  Sensors  Signal processing  Analog To Digital Conversion  Cmos Integrated Circuits  Differential Amplifiers  Digital Cameras  Image Sensors  Optical Data Processing  Photodiodes  Pixels  Programmed Control Systems  Sensors  Signal Processing   The Comparison of CCD and CMOS Image Sensors 会议论文  OAI收割 2008 International Conference on Optical Instruments and Technology: Advanced Sensor Technologies and Applications, Bellingham Zhang, Lihua; Jin, Yongjun; Lin, Lin; Li, Jijun; Du, Yungang 收藏  |  浏览/下载：53/0  |  提交时间：2014/12/07 CCD  CMOS Image Sensors  Comparison   The Key Technology and Research Progress of CMOS Image Sensor 会议论文  OAI收割 2008 International Conference on Optical Instruments and Technology: Advanced Sensor Technologies and Applications, Bellingham Zhang, Lihua; Li, Jijun; Lin, Lin; Du, Yungang; Jin, Yongjun 收藏  |  浏览/下载：45/0  |  提交时间：2014/12/07 Optoelectronics  CMOS image sensors  CCD  TFA TECHNOLOGY  NOISE   Geometrical modulation transfer function of different active pixel of CMOS APS (EI CONFERENCE) 会议论文  OAI收割 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005, Zian, China 作者:  Li J.;  Liu J.;  Liu J.;  Liu J.;  Li J. 收藏  |  浏览/下载：62/0  |  提交时间：2013/03/25 The geometrical Modulation Transfer Function (MTF) of CMOS APS (active pixel sensor) is analyzed in this paper. Advanced APS have been designed and fabricated where different pixel shapes such as square  rectangle and L shape  were placed  because the amplifier circuit and other function circuits inter pixel of APS take up some pixel area. MTF is an important figure of merit in focal plane array imaging sensors. Research on analyzing the MTF for the proper pixel shape is currently in progress for a centroidal configuration of a target position. MTF will give us a more complete understanding of the tradeoffs opposed by the different pixel designs and by the signal processing conditions. Based on image sensor sampling and reconstructing model  the MTF expression of any active pixel shape has been deduced in this paper. According to actual pixel shape  three different active area pixels were analyzed  they were square  rectangle  and L shape  their Fill Factor (FF) is 30%  44% and 55%  respectively. Results of simulation experiments indicate that different pixel geometrical characteristics contribute significantly to the figures of their MTF. Different geometrical shape of active sensitive area of pixel and different station in pixel would influence MTF figures. The analysis results are important in designing better APS pixel and more important in analyzing imaging system performance of APS subpixel precision system.