机构

• 金属研究所 [2]
• 长春光学精密机械与物... [1]
• 光电技术研究所 [1]
• 合肥物质科学研究院 [1]

采集方式

• OAI收割 [5]

内容类型

• 期刊论文 [4]
• 会议论文 [1]

发表日期

• 2018 [2]
• 2017 [1]
• 2010 [1]
• 2008 [1]

学科主题

• Chemistry,... [1]
• Chemistry,... [1]
• Materials ... [1]
• Nanoscienc... [1]
• Physics, A... [1]
• Physics, C... [1]
• 更多

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Non-Drude Magneto-Transport Behavior in a Topological Crystalline Insulator/Band Insulator Heterostructure 期刊论文  OAI收割 NANO LETTERS, 2018, 卷号: 18, 期号: 10, 页码: 6538-6543 作者:  Liu, CW   |  收藏  |  浏览/下载：65/0  |  提交时间：2018/12/25 Magneto-transport  Drude model  topological insulator  linear magneto-resistance   Non-Drude Magneto-Transport Behavior in a Topological Crystalline Insulator/Band Insulator Heterostructure 期刊论文  OAI收割 NANO LETTERS, 2018, 卷号: 18, 期号: 10, 页码: 6538-6543 作者:  Liu, Chieh-Wen;  Wei, Feng;  Premasiri, Kasun;  Liu, Shuhao;  Ma, Song   |  收藏  |  浏览/下载：44/0  |  提交时间：2021/02/02 Magneto-transport  Drude model  topological insulator  linear magneto-resistance   Terahertz transport dynamics in the metal-insulator transition of V2O3 thin film 期刊论文  OAI收割 OPTICS COMMUNICATIONS, 2017, 卷号: 387, 期号: 无, 页码: 385-389 作者:  Luo, Y. Y.;  Su, F. H.;  Zhang, C.;  Zhong, L.;  Pan, S. S. 收藏  |  浏览/下载：52/0  |  提交时间：2017/11/23 V2o3 Thin Film  Terahertz  Metal-insulator Transition  Drude-smith Model  Optical Conductivity   Infrared spectroscopic ellipsometry studies of ion-implanted and annealed silicon wafers 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2010, 卷号: 59, 期号: 3, 页码: 1632-1637 作者:  Liu Xian-Ming;  Li Bin-Cheng;  Gao Wei-Dong;  Han Yan-Ling 收藏  |  浏览/下载：20/0  |  提交时间：2015/09/21 infrared spectroscopic ellipsometry  ion implantation  Drude model  dispersion relation   Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Yang H.;  Liu L.;  Liu L. 收藏  |  浏览/下载：28/0  |  提交时间：2013/03/25 Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.