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	Weak dipolar interaction between CoPd multilayer nanodots for bit-patterned media application 期刊论文 OAI收割 MATERIALS LETTERS, 2016, 卷号: 182, 页码: 185-189 Zhao, XT; Liu, W; Dai, ZM; Li, D; Zhao, XG; Wang, ZH; Kim, D; Choi, CJ; Zhang, ZD 收藏 \| 浏览/下载：42/0 \| 提交时间：2016/12/28 Magnetic materials Multilayer structure Nanodot Anodic aluminum oxide(AAO) Magnetic force microscopy (MFM) First order reverse curves(FORC)
	Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface 期刊论文 OAI收割 SMALL, 2009, 卷号: 5, 期号: 8, 页码: 908-912 作者: Chen, Peipei; Chen, Long; Han, Dong; Zhai, Jin; Zheng, Yongmei \| 收藏 \| 浏览/下载：17/0 \| 提交时间：2019/04/09 Afm Force Curves Imaging Lotus Leaves Wettability
	Wetting behavior at micro-/nanoscales: direct imaging of a microscopic water/air/solid three-phase interface 期刊论文 iSwitch采集 Small, 2009, 卷号: 5, 期号: 8, 页码: 908-912 作者: Chen, Peipei; Chen, Long; Han, Dong; Zhai, Jin; Zheng, Yongmei 收藏 \| 浏览/下载：28/0 \| 提交时间：2019/05/10 Afm Force curves Imaging Lotus leaves Wettability
	Key techniques of laser direct writing of fine lines on the spherical surface (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Design and Fabrication, August 21, 2005 - August 26, 2005, Changchun, China Liang F.; Hu J. 收藏 \| 浏览/下载：24/0 \| 提交时间：2013/03/25 The main principles of laser direct writing (LDW) system for lines on the spherical surface (SS) are discussed. It is pointed out that line profile is determined by the exposure dose distribution which lies on the light intensity distribution of focus plane and the scanning speed. To improve the quality of line profile on the SS several key techniques as follows are introduced. Firstly the unique system configuration four axes mutually intersecting at the center of the SS is adopted which ensures the shape of the focus be maintained circular during the writing period. Secondly an automatic focus system (AFS) with the function of automatic focus in a certain range is introduced. Thirdly to guarantee the linear velocity to accord with the exposure character of the photoresist all the time an efficient arithmetic that controls motors run at appropriate angular velocity in different latitude is developed. Finally to achieve a stable and well-behaved system so as to compensate the velocity instability resulting from unavoidable errors of mechanical and electronics factor a powerful programmable multi-axis controller (PMAC) is utilized as the kernel element of the servocontrol system and the curves of step response and parabolic response achieved by feedforward and PID loop tuning indicate that the location precision and velocity stability have reached a high level. The experimental results of LDW of lines on the SS work piece with a diameter 30 mm and a radius equal to 100 mm are given. The section analysis of the lines on the photoresist by the atomic force microscope (AFM) after exposure and development is performed. The results show that line width is about 3.0 m and the steep sides of the lines are parallel to each other.
	Investigation of growth mode in ZnO thin films prepared at different temperature by plasma-molecular beam epitaxy (EI CONFERENCE) 会议论文 OAI收割 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004, 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004 Liang H. W.; Lu Y. M.; Shen D. Z.; Yan J. F.; Li B. H.; Zhang J. Y.; Liu Y. C.; Fan X. W. 收藏 \| 浏览/下载：41/0 \| 提交时间：2013/03/25 High-quality ZnO thin films on c-plane sapphire (Al2O 3) substrates were prepared by plasma-molecular beam epitaxy (P-MBE). The influence of growth temperature on growth mode of ZnO was investigated. Real-time monitored by reflection high-energy electron diffraction (RHEED) images show that below 500 C ZnO thin film was grown by three-dimension (3D) growth mode. While the two-dimension (2D) growth mode was obtained above growth temperature of 650 C. Atomic force microscopy (AFM) images present that the surface morphology of ZnO thin film with 2D growth is improved and X-ray rocking curves (XRC) indicate that the full width at half maximum (FWHM) of the ZnO (0 0 2) peak becomes narrow. From the photoluminescence (PL) spectra ultraviolet (UV) emission peak exhibits obvious blue-shift for the samples grown at lower temperature which is attributed to the effect of the quantum confinement arisen from small crystal grain sizes. The minimum carrier concentration of N=7.661016 cm-3 was obtained in the ZnO thin films with the 2D grown which is closed to that of bulk ZnO. 2005 Elsevier B.V. All rights reserved.