中国科学院机构知识库网格系统: 检索

Study of power load pattern on EAST divertor using PFCFlux code 期刊论文 OAI收割
FUSION ENGINEERING AND DESIGN, 2016, 卷号: 107, 期号: 无, 页码: 58-63
作者: Zhang, Bin; Firdaouss, Mehdi; Gong, Xianzu; Ekedahl, Annika; Peng, Xuebing

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Power Load Pattern East Divertor Pfcflux Code Grazing Angle Flux Expansion Triangularity

Grazing incidence small angle x-ray scattering study of silver nanoparticles in ion-exchanged glasses 期刊论文 iSwitch采集
Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2015, 卷号: 351, 页码: 51-55
作者: Cheng, Weidong; Wu, Zhaojun; Gu, Xiaohua; Xing, Xueqing; Mo, Guang

收藏 | 浏览/下载：69/0 | 提交时间：2018/10/11

Grazing incidence small angle x-ray scattering Nanostructured materials Annealing Ion-exchange

Achieving grazing-incidence ultra-small-angle X-ray scattering in a laboratory setup 期刊论文 OAI收割
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 卷号: 48, 页码: 608-612
作者: Zheng, Nan; Yi, Zhiyong; Li, Zhenzhen; Chen, Ran; Lai, Yuqing

收藏 | 浏览/下载：39/0 | 提交时间：2015/11/03

grazing-incidence ultra-small-angle X-ray scattering laboratory setup

Grazing incidence small angle X-ray scattering study of silver nanoparticles in ion-exchanged glasses 期刊论文 OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2015, 卷号: 351, 页码: 51-55
作者:

收藏 | 浏览/下载：55/0 | 提交时间：2016/04/18

Grazing incidence small angle X-ray scattering Nanostructured materials Annealing Ion-exchange

Temperature dependent conductivity of vapor-phase polymerized PEDOT films 期刊论文 OAI收割
Temperature dependent conductivity of vapor-phase polymerized PEDOT films, 2013, 卷号: 176, 期号: 0, 页码: 86-91
作者: Chen, LW（陈立桅）; Wu, D（吴丹）

收藏 | 浏览/下载：41/0 | 提交时间：2014/01/15

PEDOT Vapor-phase polymerization (VPP) Conductivity Crystal structure Grazing angle X-ray diffraction

Fabrication of high-efficiency ultraviolet blazed gratings by use of direct Ar2-CHF3 ion-beam etching through a rectangular photoresist mask (EI CONFERENCE) 会议论文 OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, May 24, 2011 - May 26, 2011, Beijing, China
Tan X.

收藏 | 浏览/下载：44/0 | 提交时间：2013/03/25

In ultraviolet spectroscopy groove irregularity and surface roughness of nanometer magnitude can cause a significant loss of diffraction efficiency. Therefore there is a constant need to improve the diffraction efficiency. A blazed grating can concentrate most of the light intensity into a desired diffraction order it is important to control the groove shape precisely so it is the optimum choice among gratings of different kinds of profile. As the operating wavelength of most UV spectral applications is less than 200 nm especially the blaze angle and the apical angle. We have presented a direct shaping method to fabricate EUV blazed gratings by using an ion-beam mixture of Ar+ and CHF2 +to etch K9 glass with a rectangular photoresist mask. With this method the required blaze angle is small we have succeeded in fabricating well-shaped UV blazed gratings with a 1200 line/mm groove density and 8.54 blaze angles and 1200 line/mm groove density and 11.68 blaze angles and the metrical efficiency is about 81% and 78%. The good performance of the gratings was verified by diffraction efficiency measurements. When one uses the etching model the conditions on the ion-beam grazing incident angle and the CHF3partial pressure should be noted. Besides since the etched groove shape depends on the aspect ratio of the photoresist mask ridge if we wish to fabricate larger gratings with this method we must improve the uniformity of the photoresist mask before ion-beam etching. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).

Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文 OAI收割
2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China
作者: Chen B.; Chen B.

收藏 | 浏览/下载：46/0 | 提交时间：2013/03/25

A grazing incidence x-ray scattering (XRS) method Order perturbation theory (FOPT) is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree as the x-ray wavelength is 0.154 nm have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison the root mean square (RMS) surface roughness grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.

GISAXS and SAXS studies on the spatial structures of Co nanowire arrays 期刊论文 OAI收割
中国物理C, 2011, 期号: 9, 页码: 875-879
作者: Cheng WD(程伟东); Mo G(默广); Xing XQ(邢雪青); Wang DH(王德红); Gong Y(宫宇)

收藏 | 浏览/下载：18/0 | 提交时间：2015/12/25

grazing incidence small angle X-ray scattering anode aluminum oxide nanowire array

1D-KBA microscope using double-periodic multilayer (EI CONFERENCE) 会议论文 OAI收割
Advances in X-Ray/EUV Optics and Components IV, August 3, 2009 - August 5, 2009, San Diego, CA, United states
作者: Wang Z.; Wang X.; Wang X.; Wang X.; Wang Z.

收藏 | 浏览/下载：26/0 | 提交时间：2013/03/25

To study the action of shock wave in CH target one-dimensional grazing incidence KBA microscope for 4.75keV energy was set up. Because of strong absorption in air 4.75keV energy microscope can just work in vacuum. Accordingly the alignment and assemblage will be very complicated and difficult. A special multilayer method using double periodic multilayer was proposed to solve this problem. This multilayer has high reflectivity not only for 4.75keV X-rays but also for 8keV X-rays at the same grazing incidence angle. It means 1D-KBA microscope has the same light trace for different working energies. Therefore we can implement the alignment and assembly of 4.75keV system by the help of 8keV X-rays. Because 8keV X-rays is very easy produced by X-ray tube and has strong transmittability in air the alignment and assemblage process became relatively easy. By now we have finished the alignment experiment at 8keV and obtained imaging results. The performance is about 2-3m resolution in 250m field of view. It is coincide with the calculation. 2009 SPIE.

Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文 OAI收割
Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states
Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C.

收藏 | 浏览/下载：50/0 | 提交时间：2013/03/25

A soft x-ray reflectometer with laser produced plasma source has been designed which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand both the two samples are measured by WYKO surface profiler and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO and the possible reasons of such difference have been discussed in detail. 2009 SPIE.