中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共8条,第1-8条 帮助

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Finite-element-method study of the effect of thin-film residual stresses on high-order aberrations of deformable mirrors 期刊论文  OAI收割
Surface and Coatings Technology, 2019, 卷号: 366, 页码: 35-40
作者:  
Zhang, Yaoping;  Long, Guoyun;  Zhou, Hong;  Fan, Junqi;  Cui, Hao
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Finite-element-method study of the thermal distortions of deformable mirrors for laser systems 会议论文  OAI收割
Hefei, China, November 26, 2018 - November 28, 2018
作者:  
Zhang, Yao-Ping;  Long, Guo-Yun;  Fan, Jun-Qi;  Cui, Hao
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Study on the Effect of Laser Irradiation on High-order Aberrations of Deformable Mirror by FEM 会议论文  OAI收割
Chengdu, PEOPLES R CHINAChengdu, PEOPLES R CHINA, JUN 26-29, 2018JUN 26-29, 2018
作者:  
Zhang, Yao-ping;  Zhou, Hong;  Long, Guo-yun;  Fan, Jun-qi;  Cui, Hao
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Design of reimaging F/1.0 long-wavelength infrared optical system (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, May 24, 2011 - May 24, 2011, Beijing, China
作者:  
Zhang X.;  Zhang X.;  Zhang X.
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Imaging system effects on the measuring accuracy of the optical surface in interferometer (EI CONFERENCE) 会议论文  OAI收割
3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, January 6, 2011 - January 7, 2011, Shanghai, China
Yang W.; Liu M.; Xu W.
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Design and tolerance analysis of compensator for high order aspheric surface testing (EI CONFERENCE) 会议论文  OAI收割
2009 International Conference on Optical Instruments and Technology - Optoelectronic Measurement Technology and Systems, October 19, 2009 - October 22, 2009, Shanghai, China
作者:  
Chen X.;  Liu W.;  Chen X.;  Chen X.
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Design of dual-FOV refractive/diffractive LWIR optical system (EI CONFERENCE) 会议论文  OAI收割
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China
作者:  
Wang L.-J.;  Zhang J.-P.;  Wang L.-J.;  Zhang X.;  Zhang X.
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Imaging quality analysis of KBA x-ray microscope working at grazing incidence (EI CONFERENCE) 会议论文  OAI收割
Optical Design and Testing II, November 8, 2004 - November 11, 2004, Beijing, United states
作者:  
Zhao L.
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