机构

• 金属研究所 [10]
• 上海硅酸盐研究所 [1]

采集方式

• OAI收割 [11]

内容类型

• 期刊论文 [11]

发表日期

• 2019 [3]
• 2017 [1]
• 2010 [2]
• 2008 [1]
• 2007 [1]
• 1999 [1]
• 更多

学科主题

筛选

浏览/检索结果: 共11条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Characterizing the interactions of edge dislocation dipole in hexagonal close packed Ti-Al alloys 期刊论文  OAI收割 MATERIALS & DESIGN, 2019, 卷号: 164, 页码: 7 作者:  Wu, Hao;  Leng, Jinfeng;  Teng, Xinying;  Su, Tao;  Li, Qinggang   |  收藏  |  浏览/下载：29/0  |  提交时间：2021/02/02 Titanium alloys  Homogenization/solutionization  Strengthening  Crystal defects  High-resolution electron microscopy (HREM)   Characterizing the interactions of edge dislocation dipole in hexagonal close packed Ti-Al alloys 期刊论文  OAI收割 MATERIALS & DESIGN, 2019, 卷号: 164, 页码: 7 作者:  Wu, Hao;  Leng, Jinfeng;  Teng, Xinying;  Su, Tao;  Li, Qinggang   |  收藏  |  浏览/下载：18/0  |  提交时间：2021/02/02 Titanium alloys  Homogenization/solutionization  Strengthening  Crystal defects  High-resolution electron microscopy (HREM)   Characterizing the interactions of edge dislocation dipole in hexagonal close packed Ti-Al alloys 期刊论文  OAI收割 MATERIALS & DESIGN, 2019, 卷号: 164, 页码: 7 作者:  Wu, Hao;  Leng, Jinfeng;  Teng, Xinying;  Su, Tao;  Li, Qinggang   |  收藏  |  浏览/下载：34/0  |  提交时间：2021/02/02 Titanium alloys  Homogenization/solutionization  Strengthening  Crystal defects  High-resolution electron microscopy (HREM)   Oxygen contamination on the surface of ZrB2 powders and its removal 期刊论文  OAI收割 SCRIPTA MATERIALIA, 2017, 卷号: 127, 页码: 160-164 作者:  Ma, Hai-Bin;  Zou, Ji;  Lu, Ping;  Zhu, Jing-Ting;  Fu, Zheng-Qian 收藏  |  浏览/下载：33/0  |  提交时间：2017/02/24 Borides  Surface oxygen impurities  High-resolution electron microscopy (HREM)  Electron energy loss spectroscopy (EELS)  X-ray photoelectron spectroscopy (XPS)   Expansion of interatomic distances in platinum catalyst nanoparticles 期刊论文  OAI收割 Acta Materialia, 2010, 卷号: 58, 期号: 3, 页码: 836-845 K. Du; F. Emst; M. C. Pelsozy; J. Barthel; K. Tillmann 收藏  |  浏览/下载：96/0  |  提交时间：2012/04/13 Nanoparticles  Catalysts  Atomistic structure  Quantitative  high-resolution transmission electron microscopy  Spherical-aberration-adjusted transmission electron microscopy  transmission electron-micrographs  pt-co electrocatalysts  oxygen  reduction  spherical-aberration  lattice-parameters  atomic-resolution  materials science  surface-tension  hrem images  in-situ   Microstructure Investigation on the Triple Junction with an Adjoining Twin Boundary in Nanocrystalline Palladium 期刊论文  OAI收割 Journal of Materials Science & Technology, 2010, 卷号: 26, 期号: 11, 页码: 1047-1050 Y. C. Wang; Z. X. Su; D. H. Ping 收藏  |  浏览/下载：17/0  |  提交时间：2012/04/13 Triple junction  Grain boundary  Molecular statics  High-resolution  transmission electron microscopy (HRTEM)  high-purity nickel  grain-boundary  corrosion  joints  hrem   Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation 期刊论文  OAI收割 Journal of Microscopy, 2008, 卷号: 232, 期号: 1, 页码: 137-144 K. Du; M. Ruhle 收藏  |  浏览/下载：19/0  |  提交时间：2012/04/13 high-resolution transmission electron microscopy  image simulation  quantitative electron microscopy  sapphire  crystal defect structures  hrem images  interfaces  hrtem  retrieval  alpha-al2o3  microscopy  evolution  package  films   Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs 期刊论文  OAI收割 Ultramicroscopy, 2007, 卷号: 107, 期号: 4-5, 页码: 281-292 K. Du; K. von Hochmeister; F. Phillipp 收藏  |  浏览/下载：24/0  |  提交时间：2012/04/13 high-resolution transmission electron microscopy  image simulation  atomic-resolution  noise transfer  ccd cameras  hrem  scattering  microscope  diffraction  holography  package  signal   Ball-milling-induced polytypic transformation of 6H-SiC -> 3C-SiC 期刊论文  OAI收割 Science in China Series E-Technological Sciences, 1999, 卷号: 42, 期号: 1, 页码: 54-59 X. Y. Yang; G. Y. Shi; H. L. Huang; Y. K. Wu 收藏  |  浏览/下载：15/0  |  提交时间：2012/04/14 silicon carbide  polytypic transformation  ball milling (BM)  high-resolution electron microscopy (HREM)   Digital enhancement of the surface contrast in a conventional HREM image 期刊论文  OAI收割 Ultramicroscopy, 1998, 卷号: 74, 期号: 1-2, 页码: 27-33 S. Y. Li; H. Q. Ye 收藏  |  浏览/下载：31/0  |  提交时间：2012/04/14 plan-view imaging of surfaces  image processing  computer simulation  high resolution electron microscopy (HREM)  ag(110) surface