中国科学院机构知识库网格系统: 检索

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	Alignment error detection method of sub-eye mounting hole for bionic compound eye system 期刊论文 OAI收割 Chinese Optics, 2019, 卷号: 12, 期号: 4, 页码: 880-887 作者: G.Zhang; X.-H.Wang; D.-Y.Li \| 收藏 \| 浏览/下载：47/0 \| 提交时间：2020/08/24 Errors,Bionics,Image resolution,Imaging systems,Mountings,Optical design,Optical instrument lenses
	Comparison of the retrieval of sea surface salinity using different instrument configurations of MICAP 期刊论文 OAI收割 Remote Sensing, 2018, 卷号: 10, 期号: 4, 页码: 550 作者: Zhang, Lanjie; Wang, Zhenzhan; Yin, Xiaobin; Wang, Zhenzhan (wangzhenzhan@mirslab.cn) \| 收藏 \| 浏览/下载：37/0 \| 提交时间：2018/06/01 Micap Forward Model Combined Active/passive Sss Retrieval Algorithm Different Instrument Configurations Retrieval Errors
	The effects of profile errors of microlens surfaces on laser beam homogenization 期刊论文 OAI收割 Micromachines, 2017, 卷号: 8, 期号: 2, 页码: 50 作者: Cao, Axiu; Pang, Hui; Wang, Jiazhou; Zhang, Man; Chen, Jian \| 收藏 \| 浏览/下载：40/0 \| 提交时间：2018/11/20 Errors - Gears - Laser beams - Microanalysis - Microfabrication - Microlenses - Microoptics - Optical instrument lenses
	Metrology system in the raidio telescopes 会议论文 OAI收割 Guilin, China, October 7, 2015 - October 10, 2015 作者: Ban, Y.; Feng, S. F. \| 收藏 \| 浏览/下载：25/0 \| 提交时间：2017/07/04 Units Of Measurement Instrument Errors Radio Telescopes Telescopes
	Analysis of offset error for segmented micro-structure optical element based on optical diffraction theory 期刊论文 OAI收割 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2016, 卷号: 9682, 页码: 968210 作者: Su, Jinyan; Wu, Shibin; Yang, Wei; Wang, Lihua \| 收藏 \| 浏览/下载：57/0 \| 提交时间：2018/06/14 Diffraction Errors Functions Image Quality Lenses Manufacture Microstructure Mirrors Optical Instrument Lenses Optical Systems Optical Testing Telescopes
	Measuring instrument for radial composite deviations of high-precision master gear (EI CONFERENCE) 会议论文 OAI收割 6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China 作者: Zhang Y.; Wang L.; Wang L.; Wang L. 收藏 \| 浏览/下载：37/0 \| 提交时间：2013/03/25 During double flank rolling composite detection the radial composite deviations of master gears has been existed and transferred to the measured gear by the primary harmonic curve. In order to improve measurement accuracy a measuring instrument is developed for radial composite deviations of high-precision master gear in the paper. This instrument uses the structure of spring-suspend swing span to overcome the shortcomings of large rotation errors low sensitivity low resolution and large measuring force appearing in the traditional combination-type gear inspection instrument. Artificial intelligence technology is used to improve the efficiency and accuracy of this instrument. The result is that the measuring apparatus is able to meet the requirement and improve efficiency through the measuring experiments on master gears of precision grade 2 with modulus 2 mm and 3 mm respectively. 2010 SPIE.
	An introductory study on the transfer calibration of MICROTOPS II hand-held sunphotometer 会议论文 OAI收割 2nd International Conference on Information Science and Engineering, ICISE2010,, Hangzhou, China, December 4, 2010 - December 6,2010 Wang, Zuo; Li, Hu; Li, Dong-Hui; Yu, Tao; Li, Xiao-Ying; Gao, Hai-Liang 收藏 \| 浏览/下载：14/0 \| 提交时间：2014/12/07 Calibration Information science Instrument errors Photometers Photometry
	Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE) 会议论文 OAI收割 Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006, Xinjiang, China 作者: Zhang Y.; Wang X.; Wang X.; Wang X.; Wang L. 收藏 \| 浏览/下载：31/0 \| 提交时间：2013/03/25 Reference level involute is used for evaluating other involutes but it is very difficult to measure reference level involute exactly. Nowadays the available methods for measuring precise involute include single base disc mode electronic generation mode and CNC three-coordinate mode. But measurement accuracy of the modes above is not suitable for reference level involute. A precise instrument for measuring reference level involute double base discs instrument is introduced. It is consistent with generation principle of the involute entirely. Besides having the advantages of single basic disc instrument the instrument can remove Abbe error caused by the stylus and has no pressure deforming. The instrument's structure is described. The main sources of measurement errors are analyzed and methods for compensation are presented. Finally uncertainty of the instrument is given which meets reference level involute test specification.