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	Development of theoretical model for 3D plasma energy behavior and characteristics 期刊论文 OAI收割 INTERNATIONAL JOURNAL OF ENERGY RESEARCH, 2016, 卷号: 40, 期号: 3, 页码: 400-407 作者: Khan, Shahab Ud-Din; Song Yuntao; Liu, Xufeng; Khan, Salah Ud-Din 收藏 \| 浏览/下载：15/0 \| 提交时间：2017/07/19 Plasma Energy 3d Model Theoretical Approach Matlab Program East
	Influence of spatial temperature distribution on high accuracy interferometric metrology (EI CONFERENCE) 会议论文 OAI收割 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China 作者: Yang H.; Zhang J.; Zhang J.; Zhang J.; Yan F. 收藏 \| 浏览/下载：26/0 \| 提交时间：2013/03/25 We calculate the influence of temperature change on the refractive index of air establish a model of air temperature distribution and analyze the effect of different temperature distribution on the high accuracy interferometric metrology. First a revised Edlen formula is employed to acquire the relation between temperature and refractive index of air followed by introducing the fixed temperature gradient distribution among the spatial grid within the optical cavity between the reference flat and the test flat of the Fizeau interferometer accompanied by a temperature change random function within each grid. Finally all the rays through the air layer with different incident angles are traced by Matlab program in order to obtain the final output position angle and OPD for each ray. The influence of different temperature distribution and the length of the optical cavity in on the testing accuracy can be analyzed through the RMS value that results from repeatable rays tracing. As a result the horizontal distribution (vertical to optical axis) has a large effect on the testing accuracy. Thus to realize the high accuracy figure metrology the horizontal distribution of temperature must be rigorously controlled as well as to shorten the length of the optical cavity to a large extent. The results from our simulation are of great significant for the accuracy analysis of interferometric testing and the research of manufacturing a interferometer. 2010 Copyright SPIE - The International Society for Optical Engineering.
	Semi-physical simulation of an optoelectronic tracking servo system based on C MEX S functions (EI CONFERENCE) 会议论文 OAI收割 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China Juan C.; Junhong Z. 收藏 \| 浏览/下载：24/0 \| 提交时间：2013/03/25 To the design of an optoelectronic tracking servo system we test the method [1 not only the reasonability of the control algorithm should be considered 2]. The simulation results verify the theoretical analysis. Because C MEX S function has the features of fast execute speed but the cost and time as well. It is necessary to establish the simulation model for the system. Applying the C MEX S functions independently generated program we can build the every independent digital control modules in MATLAB/SIMULINK for the optoelectronic tracking servo system. In the paper directly download to the hardwires we apply the C MEX S function to the design of the practical optoelectronic tracking servo system. For the speed we can design and debug the digital control modules in MATLAB/SIMULINK and then transform and download directly to DSP processor. 2010 IEEE. position loop control and TV delay compensations
	Determination of optical constants of zirconia and silica thin films in UV to visible range (EI CONFERENCE) 会议论文 OAI收割 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China 作者: Liu L.; Yang H.; Liu L. 收藏 \| 浏览/下载：22/0 \| 提交时间：2013/03/25 A curve fitting method for determining the optical constants of some dielectric thin films is described with dispersion theory in the paper. A computer program based on Matlab is developed and optimized. The fitting errors are analyzed with theoretical data which gives very high accurate results. A program is applied to fitting the measured photometric spectra of ion sputtered zirconia and silica thin films in 200-850nm spectra range. The thickness is verified with the method of grazing x-ray diffraction. With the thickness known the optical constants of zirconia films near the absorption range are obtained with single-wavelength method. As a result quite good fitting results are obtained with high accuracy. Finally an ultraviolet (UV) high-pass optical filter is designed with optical constants extracted by this method. The transmission and reflection spectra of the filter are measured and compared to designed spectra. A good coherence was derived.