中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共3条,第1-3条 帮助

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Co-optimization of Dynamic/Static Test Power in Scan Test 期刊论文  OAI收割
CHINESE JOURNAL OF ELECTRONICS, 2009, 卷号: 18, 期号: 1, 页码: 54-58
作者:  
Wang Wei;  Han Yinhe;  Li Xiaowei;  Fang Fang
  |  收藏  |  浏览/下载:9/0  |  提交时间:2019/12/16
Leakage current optimization techniques during test based on don't care bits assignment 期刊论文  OAI收割
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2007, 卷号: 22, 期号: 5, 页码: 673-680
作者:  
Wang, Wei;  Hu, Yu;  Han, Yin-He;  Li, Xiao-Wei;  Zhang, You-Sheng
  |  收藏  |  浏览/下载:23/0  |  提交时间:2019/12/16
Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment 期刊论文  OAI收割
Journal of Computer Science and Technology, 2007, 卷号: 22, 期号: 5, 页码: 673-680
作者:  
Wei Wang(王伟);  Xiao-Wei Li(李晓维);  Yin-He Han(韩银和);  Yu Hu(胡瑜);  You-Sheng Zhang(张佑生)
  |  收藏  |  浏览/下载:28/0  |  提交时间:2010/11/03