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Large diameter optics support optimization based on finite element method and optical surface fitting with zernike method 会议论文  OAI收割
Shanghai, China, 2020-06-29
作者:  
Liang-Xiao, Zhao;  Jian, Zhang;  San-Feng, Hao;  Li-Min, Gao
  |  收藏  |  浏览/下载:24/0  |  提交时间:2021/03/04
Correction of Static Pointing Error of a Novel Optical Testing Target 期刊论文  OAI收割
Binggong Xuebao/Acta Armamentarii, 2019, 卷号: 40, 期号: 5, 页码: 1030-1037
作者:  
S.Zhang;  X.Xue;  Y.Gao;  G.Wang
  |  收藏  |  浏览/下载:31/0  |  提交时间:2020/08/24
Research on automatic Hartmann test of membrane mirror (EI CONFERENCE) 会议论文  OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:  
Zhang P.
收藏  |  浏览/下载:31/0  |  提交时间:2013/03/25
Electrostatic membrane mirror is ultra-lightweight and easy to acquire a large diameter comparing with traditional optical elements  so its development and usage is the trend of future large mirrors. In order to research the control method of the static stretching membrane mirror  the surface configuration must be tested. However  membrane mirror's shape is always changed by variable voltages on the electrodes  and the optical properties of membrane materials using in our experiment are poor  so it is difficult to test membrane mirror by interferometer and null compensator method. To solve this problem  an automatic optical test procedure for membrane mirror is designed based on Hartmann screen method. The optical path includes point light source  CCD camera  splitter and diffuse transmittance screen. The spots' positions on the diffuse transmittance screen are pictured by CCD camera connected with computer  and image segmentation and centroid solving is auto processed. The CCD camera's lens distortion is measured  and fixing coefficients are given to eliminate the spots' positions recording error caused by lens distortion. To process the low sampling Hartmann test results  Zernike polynomial fitting method is applied to smooth the wave front. So low frequency error of the membrane mirror can be measured then. Errors affecting the test accuracy are also analyzed in this paper. The method proposed in this paper provides a reference for surface shape detection in membrane mirror research. 2010 Copyright SPIE - The International Society for Optical Engineering.  
Configuring an electrostatic membrane reflector with potentials exerted on distributed electrodes (EI CONFERENCE) 会议论文  OAI收割
2009 IEEE International Conference on Mechatronics and Automation, ICMA 2009, August 9, 2009 - August 12, 2009, Changchun, China
作者:  
Zhang P.;  Shi G.
收藏  |  浏览/下载:19/0  |  提交时间:2013/03/25
Electrostatic membrane reflector (EMR) is very promised for optical quality application with the merits of utra-lightweight and flexible. Configuring a circular membrane reflector with electrostatic potentials exerted on distributed electrodes can approximatively produce a parabolic shape. A 300mm EMR (made from polyimide) stretched by distributed electrodes below is designed  and the number of concentric electrodes needed for membrane shape forming is analysed. First  based on an analytical solution of Poisson's equation  determine the membrane control matrix by finding influence functions of 3 concentric electrodes and 6 control points on membrane surface in order to compute the needed voltages exerted on the distributed electrodes by the method of least-squares fitting. Then the final shape solved by finite element analysis with ANSYS is contrasted with the paraboloid and deviates greatly when the central displacement of membrane is beyond 2.5mm  but in this range increasing the number of electrodes and control points will get a better shape. The corresponding errors are analyzed  and the control method is concluded. Only using the integrated method of analytical computation  numerical analysis and experiment  the membrane shape of certain central displacement can be exactly predicted and controlled. 2009 IEEE.  
Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Liu L.;  Yang H.;  Liu L.
收藏  |  浏览/下载:21/0  |  提交时间:2013/03/25
We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First  we obtained the structure information (the layer thickness  surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second  based on the acquired structure information  the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally  the optical band gap is verified by Taue plot method  which is well consistent with that of SE.  
Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Yang H.;  Liu L.;  Liu L.
收藏  |  浏览/下载:28/0  |  提交时间:2013/03/25
Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.  
Investigation of the precision of curved surface fitting in the measurement of near-cylindrical surfaces' mid-wavelength deformations 期刊论文  iSwitch采集
Acta physica sinica, 2005, 卷号: 54, 期号: 7, 页码: 3144-3148
作者:  
Xie, BC;  Lu, ZW;  Li, FY
收藏  |  浏览/下载:30/0  |  提交时间:2019/05/10