机构

• 半导体研究所 [3]
• 金属研究所 [1]

采集方式

• OAI收割 [3]
• iSwitch采集 [1]

内容类型

• 期刊论文 [3]
• 会议论文 [1]

发表日期

• 2002 [4]

学科主题

• 半导体材料 [2]

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序 Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating inp wafers 期刊论文  iSwitch采集 Materials science and engineering b-solid state materials for advanced technology, 2002, 卷号: 91, 页码: 521-524 作者:  Zhao, YW;  Sun, NF;  Dong, HW;  Jiao, JH;  Zhao, JQ 收藏  |  浏览/下载：45/0  |  提交时间：2019/05/12 Indium phosphide  Semi-insulating  Annealing  Picts  Photoluminescence   Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 期刊论文  OAI收割 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2002, 卷号: 91, 页码: 521-524 作者:  Zhao, YW;  Sun, NF;  Dong, HW;  Jiao, JH;  Zhao, JQ   |  收藏  |  浏览/下载：32/0  |  提交时间：2021/02/02 indium phosphide  semi-insulating  annealing  PICTS  photoluminescence   Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文  OAI收割 9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001 Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY 收藏  |  浏览/下载：55/0  |  提交时间：2010/11/15 indium phosphide  semi-insulating  annealing  PICTS  photoluminescence  SEMIINSULATING INP  INDIUM-PHOSPHIDE  FE  PHOTOLUMINESCENCE  TEMPERATURE   Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 期刊论文  OAI收割 materials science and engineering b-solid state materials for advanced technology, 2002, 卷号: 91, 期号: 0, 页码: 521-524 Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY 收藏  |  浏览/下载：108/19  |  提交时间：2010/08/12 indium phosphide  semi-insulating  annealing  PICTS  photoluminescence  SEMIINSULATING INP  INDIUM-PHOSPHIDE  FE  PHOTOLUMINESCENCE  TEMPERATURE