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Investigation on molecular structure of molten Li2BeF4 (FLiBe) salt by infrared absorption spectra and density functional theory (DFT) 期刊论文  OAI收割
JOURNAL OF MOLECULAR LIQUIDS, 2017, 卷号: 242, 期号: -, 页码: 1052-1057
作者:  
Liu, ST;  Su, T;  Cheng, JH;  An, XH;  Zhang, P
  |  收藏  |  浏览/下载:35/0  |  提交时间:2018/08/30
Ground-based optical detection of low-dynamic vehicles in near-space 期刊论文  OAI收割
optical engineering, 2017, 卷号: 56, 期号: 1
作者:  
Jing, Nan;  Li, Chuang;  Zhong, Peifeng
收藏  |  浏览/下载:25/0  |  提交时间:2017/03/06
Correction of baseline drifts due to the pressure changes between attenuated total reflection prism and human skin for noninvasive blood glucose sensing with Fourier Transform infrared spectroscopy (EI CONFERENCE) 会议论文  OAI收割
2011 International Conference on Smart Materials and Nanotechnology in Engineering, SMNE 2011, September 17, 2011 - September 18, 2011, Wuhan, China
作者:  
Wang D.
收藏  |  浏览/下载:48/0  |  提交时间:2013/03/25
Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Liu L.;  Yang H.;  Liu L.
收藏  |  浏览/下载:21/0  |  提交时间:2013/03/25
We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First  we obtained the structure information (the layer thickness  surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second  based on the acquired structure information  the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally  the optical band gap is verified by Taue plot method  which is well consistent with that of SE.  
Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Yang H.;  Liu L.;  Liu L.
收藏  |  浏览/下载:28/0  |  提交时间:2013/03/25
Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.  
Yb:Y2O2S的粉体制备和光谱性质 期刊论文  OAI收割
Chin. Opt. Lett., 2008, 卷号: 6, 期号: 2, 页码: 133, 136
姚罡; 苏良碧; 徐晓东; 郑丽和; 徐军
收藏  |  浏览/下载:835/192  |  提交时间:2009/09/24
Determination of optical constants of zirconia and silica thin films in UV to visible range (EI CONFERENCE) 会议论文  OAI收割
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China
作者:  
Liu L.;  Yang H.;  Liu L.
收藏  |  浏览/下载:27/0  |  提交时间:2013/03/25
A curve fitting method for determining the optical constants of some dielectric thin films is described with dispersion theory in the paper. A computer program based on Matlab is developed and optimized. The fitting errors are analyzed with theoretical data  which gives very high accurate results. A program is applied to fitting the measured photometric spectra of ion sputtered zirconia and silica thin films in 200-850nm spectra range. The thickness is verified with the method of grazing x-ray diffraction. With the thickness known  the optical constants of zirconia films near the absorption range are obtained with single-wavelength method. As a result  quite good fitting results are obtained with high accuracy. Finally  an ultraviolet (UV) high-pass optical filter is designed with optical constants extracted by this method. The transmission and reflection spectra of the filter are measured and compared to designed spectra. A good coherence was derived.  
A Feasible Atmospheric Correction Method to TM Image EI期刊论文  OAI收割
2007
作者:  
Liu Chuang
收藏  |  浏览/下载:18/0  |  提交时间:2012/06/11
First-principles study on the geometry and stability of CO and hydrogen coadsorption on the Ni(111)2x2 surface 期刊论文  OAI收割
Chemical Physics, 2006, 卷号: 323, 期号: 2-3, 页码: 334-340
L. Xu; H. Y. Xiao; X. T. Zu
收藏  |  浏览/下载:16/0  |  提交时间:2012/04/14
Lattice vibrations in La(Ce)Fe4Sb12 and CoSb3: Inelastic neutron scattering and theory 期刊论文  OAI收割
PHYSICAL REVIEW B, 2006, 卷号: 73, 期号: 1
Feldman, JL; Dai, PC; Enck, T; Sales, BC; Mandrus, D; Singh, DJ
收藏  |  浏览/下载:32/0  |  提交时间:2014/02/20