中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页 机构 成果 学者
  
  1. CAS IR Grid
机构
采集方式
内容类型
发表日期
学科主题
筛选

浏览/检索结果: 共9条，第1-9条 帮助

条数/页： 排序方式：
Application of the elliptic approximation model for the edge turbulence rotation measurement via the poloidal correlation reflectometer in Wendelstein 7-X 期刊论文  OAI收割
Nuclear Fusion, 2021, 卷号: 61
作者:  Han,X.;  Kr?mer-Flecken,A.
  |  收藏  |  浏览/下载：26/0  |  提交时间：2021/06/21
Investigation of turbulence rotation in the SOL and plasma edge of W7-X for different magnetic configurations 期刊论文  OAI收割
PLASMA SCIENCE & TECHNOLOGY, 2020, 卷号: 22
作者:  Kraemer-Flecken, A.;  Han, X.;  Otte, M.;  Anda, G.;  Bozhenkov, S. A.
  |  收藏  |  浏览/下载：40/0  |  提交时间：2020/11/26
Virtual characterization of the time-of-flight neutron reflectometer of the China Spallation Neutron Source 期刊论文  OAI收割
INSTRUMENTATION SCIENCE & TECHNOLOGY, 2018, 卷号: 46, 期号: 6, 页码: 583-599
作者:  Chen YB(陈元柏);  Tian, HL;  Zhang, JR;  Wang, YY;  Du, R
  |  收藏  |  浏览/下载：35/0  |  提交时间：2019/09/24
Preliminary Study of the Magnetic Perturbation Effects on the Edge Density Profiles and Fluctuations Using Reflectometers on EAST 期刊论文  OAI收割
PLASMA SCIENCE & TECHNOLOGY, 2016, 卷号: 18, 期号: 9, 页码: 879-883
作者:  Gao Yu;  Wang Yumin;  Zhang Tao;  Zhang Shoubiao;  Qu Hao
收藏  |  浏览/下载：40/0  |  提交时间：2017/08/22
Shielding design of the multi-purpose reflectometer of China spallation neutron source 期刊论文  OAI收割
ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: 15
Shen, F; Liang, TR; Yin, W; Yu, QZ; Zuo, TS; Yao, ZE; Zhu, T; Liang, TJ
收藏  |  浏览/下载：43/0  |  提交时间：2015/04/14
Shielding design of the multi-purpose reflectometer of China spallation neutron source 期刊论文  OAI收割
ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: 15, 页码: 152801
作者:  Shen F(沈飞);  Liang TR(梁泰然);  Shen, F;  Liang, TR;  Yin, W
收藏  |  浏览/下载：35/0  |  提交时间：2016/04/08
X-Mode Frequency Modulated Density Profile Reflectometer on EAST Tokamak 期刊论文  OAI收割
PLASMA SCIENCE & TECHNOLOGY, 2013, 卷号: 15, 期号: 9
作者:  Zhang Chongyang;  Liu Ahdi;  Li Hong;  Li Bin;  Zhou Chu
  |  收藏  |  浏览/下载：17/0  |  提交时间：2021/12/13
Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文  OAI收割
Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states
Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C.
收藏  |  浏览/下载：37/0  |  提交时间：2013/03/25
A soft x-ray reflectometer with laser produced plasma source has been designed  which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above  the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand  both the two samples are measured by WYKO surface profiler  and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler  which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO  and the possible reasons of such difference have been discussed in detail. 2009 SPIE.  
Optical waveguide propagation loss measurement using multiple reflections method 期刊论文  iSwitch采集
Optics communications, 2005, 卷号: 256, 期号: 1-3, 页码: 68-72
作者:  Chen, SW;  Yan, QF;  Xu, QY;  Fan, ZC;  Liu, JW
收藏  |  浏览/下载：26/0  |  提交时间：2019/05/12