中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
化学研究所 [8]
金属研究所 [1]
半导体研究所 [1]
采集方式
OAI收割 [10]
内容类型
期刊论文 [10]
发表日期
2004 [2]
2003 [3]
2002 [1]
2001 [1]
2000 [2]
1997 [1]
更多
学科主题
半导体物理 [1]
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Stacking behavior of 2-D assemblies of octa-alkoxyl-substituted phthalocyanine studied by scanning tunneling microscopy
期刊论文
OAI收割
SURFACE SCIENCE, 2004, 卷号: 559, 期号: 1, 页码: 40-46
作者:
Liu, YH
;
Yin, SX
;
Ma, CC
;
Chen, GH
;
Wang, C
  |  
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2019/04/09
Scanning Tunneling Microscopy
And Topography
Computer Simulations
Growth
Surface Structure
Morphology
Roughness
Computational investigations of the monolayer heteroepitaxial growth of Au on Ni(110)
期刊论文
OAI收割
Surface Science, 2004, 卷号: 549, 期号: 3, 页码: 227-236
R. Z. Huang
;
X. L. Ma
;
Y. M. Wang
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2012/04/14
surface structure
morphology
epitaxy
roughness
growth
and topography
surface stress
adatoms
gold
nickel
fcc transition-metals
surface-stress
multilayer relaxation
crystal-surfaces
elastic-moduli
atomic view
alloys
ni
reconstructions
energy
Fabrication, characterization and electrochemical behaviors of the orientated film of a C-60 derivative
期刊论文
OAI收割
SURFACE SCIENCE, 2003, 卷号: 536, 期号: 1-3, 页码: L408-L414
作者:
Kang, SZ
;
Xu, SL
;
Zhang, HM
;
Gan, LB
;
Wang, C
  |  
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2019/04/09
Fullerenes
Liquid-gas Interfaces
Electrochemical Methods
Surface Structure
Morphology
Roughness And Topography
Understanding tapping-mode atomic force microscopy data on the surface of soft block copolymers
期刊论文
OAI收割
SURFACE SCIENCE, 2003, 卷号: 530, 期号: 3, 页码: 136-148
作者:
Wang, Y
;
Song, R
;
Li, YS
;
Shen, JS
  |  
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2019/04/09
Atomic Force Microscopy
Electron Microscopy
Surface Structure
Morphology
Roughness
And Topography
Chiral discrimination in Langmuir and Langmuir-Blodgett film of axially chiral 1,1 '-binaphthyl acid
期刊论文
OAI收割
SURFACE SCIENCE, 2003, 卷号: 527, 期号: 1-3, 页码: L171-L176
作者:
Xu, SL
;
Kang, SZ
;
Lu, J
;
Liu, YH
;
Wang, C
  |  
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/04/09
Liquid-gas Interfaces
Atomic Force Microscopy
Surface Structure
Morphology
Roughness
And Topography
Adlayer structure of P2VB on iodine-modified Au(111) in solution
期刊论文
OAI收割
SURFACE SCIENCE, 2002, 卷号: 511, 期号: 1-3, 页码: L298-L302
作者:
Yang, GZ
;
Zeng, QD
  |  
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/04/09
Chemisorption
Gold
Scanning Tunneling Microscopy
Surface Structure
Morphology
Roughness
And Topography
In situ scanning tunneling microscopy study of adsorption of diaza-15-crown-5 on Cu(111)
期刊论文
OAI收割
SURFACE SCIENCE, 2001, 卷号: 489, 期号: 1-3, 页码: L568-L572
作者:
Wang, D
;
Xu, QM
;
Wan, LJ
;
Wang, C
;
Bai, CL
  |  
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/04/09
Ethers
Copper
Scanning Tunneling Microscopy
Surface Structure
Morphology
Roughness
And Topography
Surface imaging of fragile materials with hydrophobic atomic force microscope tips
期刊论文
OAI收割
SURFACE SCIENCE, 2000, 卷号: 467, 期号: 1-3, 页码: 185-190
作者:
Wei, ZQ
;
Wang, C
;
Bai, CL
  |  
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2019/04/09
Atomic Force Microscopy
Chemisorption
Friction
Interface States
Self-assembly
Silane
Silicon Nitride
Surface Structure
Morphology
Roughness
And Topography
Study on single-bond interaction between amino-terminated organosilane self-assembled monolayers by atomic force microscopy
期刊论文
OAI收割
SURFACE SCIENCE, 2000, 卷号: 459, 期号: 3, 页码: 401-412
作者:
Wei, ZQ
;
Wang, C
;
Zhu, CF
;
Zhou, CQ
;
Xu, B
  |  
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2019/04/09
Adhesion
Atomic Force Microscopy
Self-assembly
Silane
Silicon
Topography
X-ray Photoelectron Spectroscopy
Surface Structure
Morphology
Roughness
And
Kinetics of dissociative water adsorption on stepped Si(001), on Si(115), Si(113), Si(5,5,12) and Si(112)
期刊论文
OAI收割
surface science, 1997, 卷号: 381, 期号: 1, 页码: 1-11
Ranke W
;
Xing YR
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2010/11/17
adsorption kinetics
low energy electron diffraction
low index single crystal surfaces
silicon
surface structure
morphology
roughness
and topography
vicinal single crystal surfaces
visible and ultraviolet photoelectron spectroscopy
water
SCANNING-TUNNELING-MICROSCOPY
CYLINDRICAL SILICON CRYSTAL
MILLER INDEX SURFACES
ROOM-TEMPERATURE
VICINAL SURFACES
ATOMIC-STRUCTURE
H2O
SI(100)
CHEMISORPTION
LEED