机构

• 长春光学精密机械与物... [3]
• 半导体研究所 [3]
• 寒区旱区环境与工程研... [1]
• 重庆绿色智能技术研究... [1]
• 武汉岩土力学研究所 [1]
• 长春应用化学研究所 [1]
• 更多

采集方式

• OAI收割 [7]
• iSwitch采集 [3]

内容类型

• 期刊论文 [8]
• 会议论文 [2]

发表日期

• 2022 [1]
• 2019 [1]
• 2017 [1]
• 2012 [1]
• 2011 [2]
• 2010 [1]
• 更多

学科主题

• 半导体物理 [1]

筛选

浏览/检索结果: 共10条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Quantitative Characterization Method for Rock Surface Roughness with Different Scale Fluctuation 期刊论文  OAI收割 KSCE JOURNAL OF CIVIL ENGINEERING, 2022, 页码: 17 作者:  Guo, Yuhang;  Zhang, Chuanqing;  Xiang, Hang;  Cui, Guojian;  Meng, Fanzhen   |  收藏  |  浏览/下载：45/0  |  提交时间：2022/04/11 Structural surface  Roughness  Quantitative characterization  Power spectral density  Statistical parameters   Characterizing curved surface roughness of Wolter-I X-ray grazing incidence telescope 期刊论文  OAI收割 Chinese Optics, 2019, 卷号: 12, 期号: 3, 页码: 587-595 作者:  Y.-C.Zhang;  P.Liu;  X.-G.Wang;  L.-P.He;  B.Chen   |  收藏  |  浏览/下载：24/0  |  提交时间：2020/08/24 Surface roughness,Mirrors,Power spectral density,Spectral density,Surface measurement,Surface scattering,Telescopes,X ray scattering   Experimental investigation on densification behavior and surface roughness of AlSi10Mg powders produced by selective laser melting 期刊论文  OAI收割 OPTICS AND LASER TECHNOLOGY, 2017, 卷号: 96, 页码: 88-96 作者:  Wang, Lin-zhi;  Wang, Sen;  Wu, Jiao-jiao   |  收藏  |  浏览/下载：29/0  |  提交时间：2018/03/05 Laser energy density  Selective laser melting  Densification behavior  Surface roughness   Mechanical properties of polymeric nanostructures fabricated through directed self-assembly of symmetric diblock and triblock copolymers 期刊论文  OAI收割 journal of vacuum science & technology b, 2012, 卷号: 30, 期号: 6, 页码: 文献号：06f204 Delcambre SP; Ji SX; Nealey PF 收藏  |  浏览/下载：13/0  |  提交时间：2013/10/09 FORMING BLOCK-COPOLYMERS  LINE EDGE ROUGHNESS  CHEMICALLY NANOPATTERNED SURFACES  DEVICE-ORIENTED STRUCTURES  THIN-FILMS  DENSITY MULTIPLICATION  EQUILIBRIUM BEHAVIOR  PATTERNED SURFACES  CAPILLARY FORCES  CYLINDER   Fabrication of high-efficiency ultraviolet blazed gratings by use of direct Ar2-CHF3 ion-beam etching through a rectangular photoresist mask (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, May 24, 2011 - May 26, 2011, Beijing, China Tan X. 收藏  |  浏览/下载：25/0  |  提交时间：2013/03/25 In ultraviolet spectroscopy  groove irregularity and surface roughness of nanometer magnitude can cause a significant loss of diffraction efficiency. Therefore  there is a constant need to improve the diffraction efficiency. A blazed grating can concentrate most of the light intensity into a desired diffraction order  it is important to control the groove shape precisely  so it is the optimum choice among gratings of different kinds of profile. As the operating wavelength of most UV spectral applications is less than 200 nm  especially the blaze angle and the apical angle. We have presented a direct shaping method to fabricate EUV blazed gratings by using an ion-beam mixture of Ar+ and CHF2 +to etch K9 glass with a rectangular photoresist mask. With this method  the required blaze angle is small  we have succeeded in fabricating well-shaped UV blazed gratings with a 1200 line/mm groove density and 8.54 blaze angles and 1200 line/mm groove density and 11.68 blaze angles  and the metrical efficiency is about 81% and 78%. The good performance of the gratings was verified by diffraction efficiency measurements. When one uses the etching model  the conditions on the ion-beam grazing incident angle and the CHF3partial pressure should be noted. Besides  since the etched groove shape depends on the aspect ratio of the photoresist mask ridge  if we wish to fabricate larger gratings with this method  we must improve the uniformity of the photoresist mask before ion-beam etching. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).   Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文  OAI收割 2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China 作者:  Chen B.;  Chen B. 收藏  |  浏览/下载：25/0  |  提交时间：2013/03/25 A grazing incidence x-ray scattering (XRS) method  Order perturbation theory (FOPT)  is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced  which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree  as the x-ray wavelength is 0.154 nm  have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison  the root mean square (RMS) surface roughness  grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM  which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.   Estimating aerodynamic resistance of rough surfaces using angular reflectance 期刊论文  iSwitch采集 REMOTE SENSING OF ENVIRONMENT, 2010, 卷号: 114, 期号: 7, 页码: 1462-1470 作者:  Chappell, Adrian;  Van Pelt, Scott;  Zobeck, Ted;  Dong, Zhibao 收藏  |  浏览/下载：34/0  |  提交时间：2019/10/08 Dust emission model  Wind erosion  Sheltering  Erodible  Flow separation  Drag  Wake  Aerodynamic resistance  Aerodynamic roughness length  Shadow  Illumination  Ray-casting  Digital elevation model  Roughness density  Frontal area index  Angular reflectance  Bi-directional reflectance   Dislocation scattering in alxga1-xn/gan heterostructures 期刊论文  iSwitch采集 Applied physics letters, 2008, 卷号: 93, 期号: 18, 页码: 3 作者:  Xu, Xiaoqing;  Liu, Xianglin;  Han, Xiuxun;  Yuan, Hairong;  Wang, Jun 收藏  |  浏览/下载：34/0  |  提交时间：2019/05/12 Aluminium compounds  Dislocation density  Electron mobility  Gallium compounds  Iii-v semiconductors  Interface roughness  Semiconductor heterojunctions  Two-dimensional electron gas  Wide band gap semiconductors   Dislocation scattering in AlxGa1-xN/GaN heterostructures 期刊论文  OAI收割 applied physics letters, 2008, 卷号: 93, 期号: 18, 页码: art. no. 182111 Xu, XQ; Liu, XL; Han, XX; Yuan, HR; Wang, J; Guo, Y; Song, HP; Zheng, GL; Wei, HY; Yang, SY; Zhu, QS; Wang, ZG 收藏  |  浏览/下载：71/0  |  提交时间：2010/03/08 aluminium compounds  dislocation density  electron mobility  gallium compounds  III-V semiconductors  interface roughness  semiconductor heterojunctions  two-dimensional electron gas  wide band gap semiconductors   Effect of the ratio of tmin flow to group iii flow on the properties of ingan/gan multiple quantum wells 期刊论文  iSwitch采集 Acta physica sinica, 2004, 卷号: 53, 期号: 8, 页码: 2467-2471 作者:  Zhang, JC;  Wang, JF;  Wang, YT;  Hui, Y 收藏  |  浏览/下载：34/0  |  提交时间：2019/05/12 Triple-axis x-ray diffraction  Interface roughness  Dislocation density  Ingan/gan multiple quantum wells