机构

• 半导体研究所 [2]

采集方式

• OAI收割 [2]

内容类型

• 期刊论文 [2]

发表日期

• 2011 [2]

学科主题

• 半导体材料 [1]
• 半导体物理 [1]

筛选

浏览/检索结果: 共2条，第1-2条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Microscopic study on the carrier distribution in optoelectronic device structures: Experiment and modeling 期刊论文  OAI收割 proceedings of spie- the international society for optical engineering, 2011, 卷号: 8308, 页码: 83081y Huang, Wenchao; Xia, Hui; Wang, Shaowei; Deng, Honghai; Wei, Peng; Li, Lu; Liu, Fengqi; Li, Zhifeng; Li, Tianxin 收藏  |  浏览/下载：26/0  |  提交时间：2012/06/14 Capacitance  Carrier concentration  Characterization  Diffusion  Optoelectronic devices  Photodetectors  Scanning  Semiconductor device structures  Semiconductor devices  Semiconductor quantum wells  Thermionic emission   Influence of growth temperatures on the quality of InGaAs/GaAs quantum well structure grown on Ge substrate by molecular beam epitaxy 期刊论文  OAI收割 journal of semiconductors, Journal of Semiconductors, 2011, 2011, 卷号: 32, 32, 期号: 4, 页码: 43004, 43004 作者:  He, Jifang;  Shang, Xiangjun;  Li, Mifeng;  Zhu, Yan;  Chang, Xiuying   |  收藏  |  浏览/下载：83/0  |  提交时间：2012/06/14 Atomic force microscopy  Buffer layers  Epitaxial growth  Gallium alloys  Gallium arsenide  Germanium  Growth temperature  High resolution transmission electron microscopy  Molecular beam epitaxy  Molecular beams  Semiconducting gallium  Semiconductor device structures  Semiconductor quantum wells  Atomic Force Microscopy  Buffer Layers  Epitaxial Growth  Gallium Alloys  Gallium Arsenide  Germanium  Growth Temperature  High Resolution Transmission Electron Microscopy  Molecular Beam Epitaxy  Molecular Beams  Semiconducting Gallium  Semiconductor Device Structures  Semiconductor Quantum Wells