中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共7条,第1-7条 帮助

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Investigation of Na2CO3-CaO-NaCl (or Na3AlF6) additives for the remanufacturing of silicon from diamond wire saw silicon powder waste 期刊论文  OAI收割
JOURNAL OF CLEANER PRODUCTION, 2021, 卷号: 286, 页码: 13
作者:  
Yang, Shicong;  Wan, Xiaohan;  Wei, Kuixian;  Ma, Wenhui;  Wang, Zhi
  |  收藏  |  浏览/下载:49/0  |  提交时间:2021/03/29
Enhancing impurities removal from Si by controlling crystal growth in directional solidification refining with Al-Si alloy 期刊论文  OAI收割
JOURNAL OF ALLOYS AND COMPOUNDS, 2020, 卷号: 820, 页码: 10
作者:  
Qian, Guoyu;  Sun, Liyuan;  Chen, Hang;  Wang, Zhi;  Wei, Kuixian
  |  收藏  |  浏览/下载:53/0  |  提交时间:2020/03/24
Boron and Phosphorus Removal During High Purity Hypereutectic Al-Si Solidification 期刊论文  OAI收割
METALS AND MATERIALS INTERNATIONAL, 2020, 卷号: 26
作者:  
Li, Yanlei;  Chen, Jian
  |  收藏  |  浏览/下载:45/0  |  提交时间:2020/11/26
Dissolution and mineralization behavior of metallic impurity content in diamond wire saw silicon powder during acid leaching 期刊论文  OAI收割
JOURNAL OF CLEANER PRODUCTION, 2020, 卷号: 248, 页码: 13
作者:  
Yang, Shicong;  Wan, Xiaohan;  Wei, Kuixian;  Ma, Wenhui;  Wang, Zhi
  |  收藏  |  浏览/下载:41/0  |  提交时间:2020/03/24
Impurity Distribution after Solidification of Hypereutectic Al-Si Melts and Eutectic Al-Si Melt 期刊论文  OAI收割
HIGH TEMPERATURE MATERIALS AND PROCESSES, 2019, 卷号: 38, 期号: 1, 页码: 389-395
作者:  
Li, Yanlei;  Chen, Jian;  Dai, Songyuan
  |  收藏  |  浏览/下载:38/0  |  提交时间:2020/07/14
Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature 期刊论文  OAI收割
journal of membrane science, 2015, 卷号: 492, 期号: 1, 页码: 173-180
作者:  
Liu, Yan;  Zhu, Xuefeng;  Li, Mingrun;  Li, Wenping;  Yang, Weishen
收藏  |  浏览/下载:28/0  |  提交时间:2015/11/16
IAD-Si coatings on RB-SiC space mirrors for ultra-smooth surfaces (EI CONFERENCE) 会议论文  OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, November 19, 2008 - November 21, 2008, Chengdu, China
作者:  
Xu L.;  Wang X.;  Wang X.;  Wang X.;  Zhang F.
收藏  |  浏览/下载:37/0  |  提交时间:2013/03/25
To eliminate surface limitation caused by Silicon impurity in RB-SiC space mirrors  a relatively thick Si film is deposited on well finished RB-SiC substrate by a new process-ion assisted depositing (IAD) to provide a better polishable surface. Testing results of IAD-Si properties are provided  showing that the amorphous film has great thermal shock resistance. Then  polishing experiments on 100.5m thick IAD-Si layers are accomplished focusing on smoother surface. Surface figure and micro-roughness of the coating after polished reach 0.026 RMS (=0.6328nm) and less than 0.5nm RMS respectively. Moreover  reflectivity of IAD-Si polished surface with reflective films increases higher than 4.5% than that of RB-SiC in 360-1100nm. High reflectivity and desirable thermal property make IAD-Si an attractive coating material for RB-SiC space mirrors. 2009 SPIE.