中国科学院机构知识库网格
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A new sustainable concept for silicon recovery from diamond wire saw silicon powder waste: Source control and comprehensive conservation 期刊论文  OAI收割
JOURNAL OF CLEANER PRODUCTION, 2022, 卷号: 358, 页码: 13
作者:  
Yang, Shicong;  Wan, Xiaohan;  Wei, Kuixian;  Ma, Wenhui;  Wang, Zhi
  |  收藏  |  浏览/下载:30/0  |  提交时间:2023/02/24
Silicon Oxide Electron-Emitting Nanodiodes 期刊论文  OAI收割
ADVANCED ELECTRONIC MATERIALS, 2018, 卷号: 4, 期号: 8, 页码: 6
作者:  
Wu, Gongtao;  Li, Zhiwei;  Tang, Zhigiang;  Wei, Dapeng;  Zhang, Gengmin
  |  收藏  |  浏览/下载:37/0  |  提交时间:2018/09/25
Development and performance test of dynamic simulation system for X-ray pulsar navigation 期刊论文  OAI收割
acta physica sinica, 2017, 卷号: 66, 期号: 5
作者:  
Xu Neng;  Sheng Li-Zhi
收藏  |  浏览/下载:47/0  |  提交时间:2017/05/03
Mechanical research and development of a monocrystalline silicon neutron beam window for CSNS 期刊论文  OAI收割
CHINESE PHYSICS C, 2015, 卷号: 39, 期号: 9, 页码: 96001
作者:  
Zhou L(周良);  Qu HM(屈化民);  Zhou, L;  Qu, HM
收藏  |  浏览/下载:41/0  |  提交时间:2016/04/18
Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文  OAI收割
Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states
Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C.
收藏  |  浏览/下载:29/0  |  提交时间:2013/03/25
A soft x-ray reflectometer with laser produced plasma source has been designed  which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above  the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand  both the two samples are measured by WYKO surface profiler  and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler  which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO  and the possible reasons of such difference have been discussed in detail. 2009 SPIE.  
Enhanced hydrogen desorption from Si sites during low-temperature Si1-xGex growth by disilane and solid-Ge molecular beam epitaxy 期刊论文  OAI收割
journal of applied physics, 1999, 卷号: 85, 期号: 9, 页码: 6920-6922
Liu JP; Huang DD; Li JP; Lin YX; Sun DZ; Kong MY
收藏  |  浏览/下载:52/0  |  提交时间:2010/08/12
晶化时间及硅源对SAPO-5分子筛的结构及模板剂状态的影响 期刊论文  OAI收割
波谱学杂志, 1995, 卷号: 12, 期号: 2, 页码: 147-153
肖天存; 安立敦; 王弘立; 邓风; 杨年华; 裘鉴卿
收藏  |  浏览/下载:23/0  |  提交时间:2015/07/09