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CAS IR Grid
机构
长春光学精密机械与物... [3]
上海光学精密机械研究... [1]
采集方式
OAI收割 [4]
内容类型
会议论文 [3]
期刊论文 [1]
发表日期
2011 [1]
2009 [1]
2008 [1]
2005 [1]
学科主题
光学材料;晶体 [1]
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Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE)
会议论文
OAI收割
2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China
作者:
Chen B.
;
Chen B.
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2013/03/25
A grazing incidence x-ray scattering (XRS) method
Order perturbation theory (FOPT)
is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced
which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree
as the x-ray wavelength is 0.154 nm
have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison
the root mean square (RMS) surface roughness
grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM
which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.
Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE)
会议论文
OAI收割
Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states
Yan-li M.
;
Yong-gang W.
;
Shu-yan C.
;
Bo C.
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  |  
浏览/下载:37/0
  |  
提交时间:2013/03/25
A soft x-ray reflectometer with laser produced plasma source has been designed
which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above
the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand
both the two samples are measured by WYKO surface profiler
and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler
which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO
and the possible reasons of such difference have been discussed in detail. 2009 SPIE.
化学抛光和退火对钛酸锶基片表面改性研究
期刊论文
OAI收割
人工晶体学报, 2008, 卷号: 37, 期号: 5, 页码: 1107, 1112
陈光珠
;
杭寅
;
汪隽等
收藏
  |  
浏览/下载:1119/122
  |  
提交时间:2009/09/24
Atomic forces
Crystal qualities
Mechanical methods
Rocking curves
SrTiO
3
Super-smooth surface
Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE)
会议论文
OAI收割
ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China
Zhou C.
;
Li H.
;
Chen C.
;
Zhou C.
;
Qian S.
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2013/03/25
Profile error of super smooth surface of optical elements at X-ray/EUV in synchrotron radiation (SR) light beam line is described as slope error of them generally. The Long Trace Profiler (LPT) is used for testing surface slope error of SR optical elements in world generally. It is requisite to use In-suit LTP measuring surface thermal distortion of SR optical elements with high heat under high bright SR source. Authors design an In-suit LTP by means of co-path interferometer with pencil light beam. The instrument not only can be used for testing slope error of mirrors in Lab. also in situation test the distortion of mirror with high heat load at synchrotron light beam line. The device can be used to test various absolute surface figures of optical elements such as aspherieal
spherical and plane. It is needless standard reference surface. It is named by LTP-III. This paper describes its basic operating principle
optical system
mechanical constructions
DC serve motor control system
array detector
data acquisition system and computer system for controlling and data analysis of LTP-III. The Instrument has advantages of high accuracy
low cost
multifunction and wide application. Length of surface measured of optical element accuracy is 0.04 arcsec.