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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
上海应用物理研究所 [3]
长春光学精密机械与物... [2]
高能物理研究所 [2]
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OAI收割 [7]
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期刊论文 [5]
会议论文 [2]
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2016 [1]
2015 [1]
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Physics [1]
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Beam dynamics of the superconducting wiggler on the SSRF storage ring
期刊论文
OAI收割
CHINESE PHYSICS C, 2016, 卷号: 40, 期号: 3, 页码: —
作者:
Zhang, QL
;
Tian, SQ
;
Jiang, BC
;
Xu, JP
;
Zhao, ZT
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2016/09/12
SYNCHROTRON-RADIATION
LIGHT-SOURCE
Design of vibrating wire alignment system for HEPS-TF
期刊论文
OAI收割
HIGH POWER LASER AND PARTICLE BEAMS, 2015, 卷号: 27, 期号: 9, 页码: 95102
作者:
Wu L(吴蕾)
;
Wang XL(王小龙)
;
Li CH(李春华)
;
Chen SY(陈素颖)
;
Qu HM(屈化民)
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2016/04/18
Alignment technique
Alignment tolerance
Circuit structures
Control and data acquisition systems
High energy photons
Mechanical structures
Synchrotron radiation light source
Vibrating wire
Performance of the infrared microspectroscopy station at SSRF
期刊论文
OAI收割
INFRARED PHYSICS & TECHNOLOGY, 2014, 卷号: 67, 页码: 521—525
Zhang, ZY
;
Chen, M
;
Tong, YJ
;
Ji, T
;
Zhu, HC
;
Peng, WW
;
Zhang, M
;
Li, YJ
;
Xiao, TQ
收藏
  |  
浏览/下载:33/0
  |  
提交时间:2015/03/13
CANADIAN LIGHT-SOURCE
SYNCHROTRON-RADIATION
RESOLUTION LIMITS
BEAMLINE
SPECTROMICROSCOPY
SPECTROSCOPY
FACILITY
CELLS
High-performance soft x-ray spectromicroscopy beamline at SSRF (EI CONFERENCE)
会议论文
OAI收割
作者:
Xue C.
;
Chen J.
;
Wang Y.
;
Wang Y.
;
Wang Y.
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2013/03/25
The Shanghai Synchrotron Radiation Facility (SSRF) is the first third-generation synchrotron facility in China and operated at an electron energy of 3.5 GeV. One of the seven beamlines in the first construction phase is devoted to soft x-ray spectromicroscopy and is equipped with an elliptically polarized undulator light source
a plane grating monochromator
and a scanning transmission x-ray microscope end station. Initial results reveal the high performance of this beamline
with an energy resolving power estimated to be over 10 000 at the argon L-edge and a spatial resolution better than 30 nm. 2010 American Institute of Physics.
Shanghai Synchrotron Radiation Facility
期刊论文
OAI收割
CHINESE SCIENCE BULLETIN, 2009, 卷号: 54, 期号: 22, 页码: 11
Jiang, MH
;
Yang, X
;
Xu, HJ(徐洪杰)
;
Zhao, ZT(赵振堂)
;
Ding, H
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2012/04/11
synchrotron radiation
light source
SSRF
construction
commissioning
Error mechanism of light source for synchrotron radiation computed tomography technique
期刊论文
OAI收割
ACTA PHYSICA SINICA, 2008, 卷号: 57, 期号: 10, 页码: 6202-6206
作者:
Wang, M
;
Cen, YW
;
Hu, XF
;
Yu, XL
;
Zhu, PP
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2016/06/29
synchrotron radiation
computed tomography
light source
error
Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE)
会议论文
OAI收割
ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China
Zhou C.
;
Li H.
;
Chen C.
;
Zhou C.
;
Qian S.
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  |  
浏览/下载:35/0
  |  
提交时间:2013/03/25
Profile error of super smooth surface of optical elements at X-ray/EUV in synchrotron radiation (SR) light beam line is described as slope error of them generally. The Long Trace Profiler (LPT) is used for testing surface slope error of SR optical elements in world generally. It is requisite to use In-suit LTP measuring surface thermal distortion of SR optical elements with high heat under high bright SR source. Authors design an In-suit LTP by means of co-path interferometer with pencil light beam. The instrument not only can be used for testing slope error of mirrors in Lab. also in situation test the distortion of mirror with high heat load at synchrotron light beam line. The device can be used to test various absolute surface figures of optical elements such as aspherieal
spherical and plane. It is needless standard reference surface. It is named by LTP-III. This paper describes its basic operating principle
optical system
mechanical constructions
DC serve motor control system
array detector
data acquisition system and computer system for controlling and data analysis of LTP-III. The Instrument has advantages of high accuracy
low cost
multifunction and wide application. Length of surface measured of optical element accuracy is 0.04 arcsec.