中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共9条,第1-9条 帮助

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A comparison of methods to harmonize cortical thickness measurements across scanners and sites 期刊论文  OAI收割
NEUROIMAGE, 2022, 卷号: 261, 页码: 19
作者:  
Sun, Delin;  Rakesh, Gopalkumar;  Haswell, Courtney C.;  Logue, Mark;  Baird, C. Lexi
  |  收藏  |  浏览/下载:53/0  |  提交时间:2023/01/06
Monte carlo simulation of biological shielding parameters in pgnaa 期刊论文  iSwitch采集
Micro & nano letters, 2018, 卷号: 13, 期号: 4, 页码: 457-460
作者:  
Yang, Jianbo;  Peng, Kexin;  Qiao, Yujie;  Zhang, Can;  Li, Rui
收藏  |  浏览/下载:77/0  |  提交时间:2019/04/23
Monte Carlo simulation of biological shielding parameters in PGNAA 期刊论文  OAI收割
MICRO & NANO LETTERS, 2018, 卷号: 13, 期号: 4, 页码: 457-460
作者:  
Li, R;  Yang, JB;  Peng, KX;  Qiao, YJ;  Zhang, C
  |  收藏  |  浏览/下载:60/0  |  提交时间:2019/09/24
Structure and thickness-dependent gas sensing responses to NO2 under UV irradiation for the multilayered ZnO micro/nanostructured porous thin films 期刊论文  OAI收割
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2017, 卷号: 503, 期号: 无, 页码: 150-158
作者:  
Su, Xingsong;  Duan, Guotao;  Xu, Zongke;  Zhou, Fei;  Cai, Weiping
收藏  |  浏览/下载:31/0  |  提交时间:2018/06/04
Effects of site conditions on earthquake ground motion and their applications in seismic design in loess region 期刊论文  OAI收割
Journal of Mountain Science, 2017, 卷号: 14, 期号: 6, 页码: 1185-1193
作者:  
WANG Lan-min;  WU Zhi-jian;  XIA Kun
  |  收藏  |  浏览/下载:18/0  |  提交时间:2017/06/21
Transparent YAG:Ce ceramics for WLEDs with high CRI: Ce3+ concentration and sample thickness effects 期刊论文  OAI收割
CERAMICS INTERNATIONAL, 2016, 卷号: 42, 期号: 6, 页码: 6935-6941
作者:  
Hu, Song;  Lu, Chunhua;  Zhou, Guohong;  Liu, Xiaoxia;  Qin, Xianpeng
收藏  |  浏览/下载:26/0  |  提交时间:2017/02/27
Epitaxial growth of Mn-Co-Ni-O thin films and thickness effects on the electrical properties 期刊论文  OAI收割
Materials Letters, 2014, 卷号: 130, 期号: 9, 页码: 127-130
作者:  
Ji, Guang;  Chang, Aimin;  Li, Hongyi;  Xie, Yahong;  Zhang, Huimin
收藏  |  浏览/下载:22/0  |  提交时间:2014/11/11
Athermalization of coaxial reflective space telescope (EI CONFERENCE) 会议论文  OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, April 26, 2010 - April 29, 2010, Dalian, China
Lei Z.; Guang J.
收藏  |  浏览/下载:14/0  |  提交时间:2013/03/25
Fabrication of polysilicon thin film on glass with low-temperature UV-assisted crystallization (EI CONFERENCE) 会议论文  OAI收割
ICO20: Display Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China
Huang J. Y.; Ling Z. H.; Jing H.; Fu G. Z.; Zhao Y. H.
收藏  |  浏览/下载:30/0  |  提交时间:2013/03/25
The amorphous silicon (a-Si) film was crystallized on glass by a simple method employed ultraviolet at temperatures as low as 400C. The employ of ultraviolet enhanced the crystallization of amorphous silicon. This method is able to uniformly crystallized large-area amorphous silicon films. The polysilicon films crystallized by this way are suitable for the fabrication of thin film transistors on ordinary glass. Crystallization process is performed in a furnace. Amorphous silicon sample is placed on a hot plate and irradiated by a bank of ultraviolet lamps through a diffuser plate to improve the uniformity of light that irradiates the sample. Raman microscopy is used for analyzing the qualities of UV-assisted crystallized silicon films. By measuring the Raman spectra the effects of anneal temperature and process time on the crystallizing behavior  crystallinity and grain size of the processed films were obtained. There has a threshold temperature for crystallization of amorphous silicon film in the presence of ultraviolet irradiation with certain intensity  i.e. by ultraviolet irradiation with certain intensity only when the temperature is up to the threshold temperature  the crystallization can be triggered. The threshold temperature is 400C when the intensity of ultraviolet irradiation is 1mW/cm2. Above threshold temperature  the increase of anneal temperature increased the rate of crystallization. Crystallinity and grain size extracted from Raman spectra of samples increase with the extending of process time at certain temperature. Crystallization of amorphous silicon film with thickness of 50nm completed within 6 hours at 400C irradiated by ultraviolet with intensity of 2mW/cm2.