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	Terahertz High-Gain Offset Reflector Antennas Using SiC and CFRP Material 期刊论文 OAI收割 IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 2017, 卷号: 65, 期号: 9, 页码: 4443-4451 作者: Wang, Hongjian; Dong, Xingchao; Yi, Min; Xue, Fei; Liu, Yang \| 收藏 \| 浏览/下载：38/0 \| 提交时间：2017/10/18 Dual Polarization Electroforming Silicon Carbide (Sic) Terahertz (Thz) High-gain Antenna Three-coordinate Test
	Miniaturize photoelectric stable platform (EI CONFERENCE) 会议论文 OAI收割 2010 International Conference on Computer Application and System Modeling, ICCASM 2010, October 22, 2010 - October 24, 2010, Shanxi, Taiyuan, China Xue W.-Q.; Wang Y.-Y.; Dai M. 收藏 \| 浏览/下载：81/0 \| 提交时间：2013/03/25 In order to reduce the size and weight of the gimbal in a traditional stable platform and correct the disadvantage in size of the payload the paper first improves the gimbal which is an important component of a stable photoelectric platform that also is an important factor in affecting the size and weight of a stability platform. In this paper a closed-form solution of 3-DOF manipulator is designed according mechanical arm design principles. This manipulator is formed by a three joint axes whose extended line is intersected at one point. A standard orthogonal coordinate system is set up for each rod in the manipulator. And then rotation transformation matrix expression is obtained. At last in this paper the manipulator arm-shaped method for solving solutions is description and also each parameter of the gimbal is calculated when the photoelectric detection devices at bottom reach the expected position. Test results show that the photoelectric stability platform with gimbal we designed is smaller lighter and simpler than that traditional. Also the packaging and size of the photoelectric will not be affected with this open structure. 2010 IEEE.
	Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE) 会议论文 OAI收割 Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006, Xinjiang, China 作者: Zhang Y.; Wang X.; Wang X.; Wang X.; Wang L. 收藏 \| 浏览/下载：33/0 \| 提交时间：2013/03/25 Reference level involute is used for evaluating other involutes but it is very difficult to measure reference level involute exactly. Nowadays the available methods for measuring precise involute include single base disc mode electronic generation mode and CNC three-coordinate mode. But measurement accuracy of the modes above is not suitable for reference level involute. A precise instrument for measuring reference level involute double base discs instrument is introduced. It is consistent with generation principle of the involute entirely. Besides having the advantages of single basic disc instrument the instrument can remove Abbe error caused by the stylus and has no pressure deforming. The instrument's structure is described. The main sources of measurement errors are analyzed and methods for compensation are presented. Finally uncertainty of the instrument is given which meets reference level involute test specification.