中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
数学与系统科学研究院 [3]
上海应用物理研究所 [1]
半导体研究所 [1]
近代物理研究所 [1]
采集方式
OAI收割 [6]
内容类型
期刊论文 [5]
会议论文 [1]
发表日期
2022 [2]
2020 [2]
2017 [1]
2000 [1]
学科主题
光电子学 [1]
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Asset selection based on high frequency Sharpe ratio
期刊论文
OAI收割
JOURNAL OF ECONOMETRICS, 2022, 卷号: 227, 期号: 1, 页码: 168-188
作者:
Wang, Christina Dan
;
Chen, Zhao
;
Lian, Yimin
;
Chen, Min
  |  
收藏
  |  
浏览/下载:44/0
  |  
提交时间:2022/04/29
Asset selection
High frequency Sharpe ratio
Ultrahigh dimensional
Serial correlation
Sure screening property
SPARSE COMPOSITE QUANTILE REGRESSION WITH ULTRAHIGH-DIMENSIONAL HETEROGENEOUS DATA
期刊论文
OAI收割
STATISTICA SINICA, 2022, 卷号: 32, 期号: 1, 页码: 459-475
作者:
Qu, Lianqiang
;
Hao, Meiling
;
Sun, Liuquan
  |  
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2022/04/02
Quantile regression
sparsity
ultrahigh-dimensional data
variable screening
Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs
期刊论文
OAI收割
ELECTRONICS, 2020, 卷号: 9, 期号: 8, 页码: 14
作者:
Zhao, Peixiong
;
Liu, Tianqi
;
Cai, Chang
;
He, Ze
;
Li, Dongqing
  |  
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2021/12/15
Monte-Carlo simulation
single-event upset
test standard
three-dimensional integrated circuits
ultrahigh-energy heavy ion
Model-free feature screening for ultrahigh dimensional classification
期刊论文
OAI收割
JOURNAL OF MULTIVARIATE ANALYSIS, 2020, 卷号: 178, 页码: 12
作者:
Sheng, Ying
;
Wang, Qihua
  |  
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2020/06/30
Classification accuracy
The Bayes rule
Sure screening
Ultrahigh dimensional classification
Recent Progress in the Fabrication of Low Dimensional Nanostructures via Surface-Assisted Transforming and Coupling
期刊论文
OAI收割
JOURNAL OF NANOMATERIALS, 2017, 期号: -, 页码: -
作者:
Hu, JB
;
Liang, ZF
;
Shen, KC
;
Sun, HL
;
Jiang, Z
  |  
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2018/08/30
Covalent Organic Frameworks
Scanning-tunneling-microscopy
Azide-alkyne Cycloaddition
Metal-surfaces
Graphene-nanoribbon
Catalyzed Cyclodehydrogenation
2-dimensional Polymers
Organometallic Chains
Aromatic Precursors
Ultrahigh-vacuum
In situ annealing during the growth of relaxed SiGe
会议论文
OAI收割
conference on optical and infrared thin films, san diego, ca, 36739
Li DZ
;
Huang CJ
;
Cheng BW
;
Wang HJ
;
Yu Z
;
Zhang CH
;
Yu JZ
;
Wang QM
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2010/10/29
Ultrahigh Vacuum Chemical Vapor Deposition
SiGe
Refractive High Energy Electron Diffraction
tansmission electron microscopy
Double Crystal X-Ray Diffraction
MOBILITY 2-DIMENSIONAL ELECTRON
CRITICAL THICKNESS
STRAINED LAYERS
GE
RELAXATION
EPILAYERS
SI1-XGEX
GESI/SI
GASES