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Linearity measurement for image-intensified CCD (EI CONFERENCE) 会议论文  OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:  
Zhang L.;  Zhao Y.;  Zhao Y.;  Zhao Y.;  Yan F.
收藏  |  浏览/下载:32/0  |  提交时间:2013/03/25
To the characteristic of the ultraviolet CCD (UV ICCD)  technique of the linearity measurement of the UV ICCD camera is studied based on the theory of radiometry. Approach of linearity measurement is discussed  and a kind of measurement system of the UV ICCD has been developed based on the method of neutral density filter. It is very important that the transmittance of the filter is independent of the wavelength in the method of neutral density filter. Black metal screen mesh with different transmittance is used in our system  and calibration of the filters' transmittance in different working positions has been done. Meanwhile  to assure the uniform of the received radiation on the target of the detector at any test points  an integrating sphere is placed behind the neutral filter to balance light. The whole measurement system mainly consists of a deuterium lamp with high stabilization  the attenuation film with transmission  integrating sphere  optical guide and electro-shift platform. Auto control is realized via special software during the test. With this instrument  the linearity of the UV ICCD was measured. Experimental results show that the nonlinearity of the UV ICCD under fixed-gain is less than 2% and the uncertainty of measurement system is less than 4%. 2010 Copyright SPIE - The International Society for Optical Engineering.  
Solid organic UV filter for solar blind detection 期刊论文  OAI收割
Optical Materials, 2009, 卷号: 31, 期号: 11, 页码: 1741-1744
Z. H. Xu, X. X. Zhuang and G. B. Su
收藏  |  浏览/下载:14/0  |  提交时间:2012/11/06
A new ultraviolet filter: Rb2Ni (SO4)(2) center dot 6H(2)O (RNSH) single crystal 期刊论文  OAI收割
Optical Materials, 2008, 卷号: 31, 期号: 2, 页码: 233-236
X. Wang; X. X. Zhuang; G. B. Su and Y. P. He
收藏  |  浏览/下载:83/0  |  提交时间:2013/01/22
Determination of optical constants of zirconia and silica thin films in UV to visible range (EI CONFERENCE) 会议论文  OAI收割
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China
作者:  
Liu L.;  Yang H.;  Liu L.
收藏  |  浏览/下载:27/0  |  提交时间:2013/03/25
A curve fitting method for determining the optical constants of some dielectric thin films is described with dispersion theory in the paper. A computer program based on Matlab is developed and optimized. The fitting errors are analyzed with theoretical data  which gives very high accurate results. A program is applied to fitting the measured photometric spectra of ion sputtered zirconia and silica thin films in 200-850nm spectra range. The thickness is verified with the method of grazing x-ray diffraction. With the thickness known  the optical constants of zirconia films near the absorption range are obtained with single-wavelength method. As a result  quite good fitting results are obtained with high accuracy. Finally  an ultraviolet (UV) high-pass optical filter is designed with optical constants extracted by this method. The transmission and reflection spectra of the filter are measured and compared to designed spectra. A good coherence was derived.