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金属研究所 [2]
长春光学精密机械与物... [1]
半导体研究所 [1]
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期刊论文 [3]
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2023 [1]
2022 [1]
2005 [1]
2002 [1]
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半导体物理 [1]
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Effects of Zn injection on corrosion behavior and crud deposition of FeCrAl fuel cladding under subcooled nuclear boiling condition in high-temperature pressurized water
期刊论文
OAI收割
CORROSION SCIENCE, 2023, 卷号: 211, 页码: 16
作者:
Xue, Chaochao
;
Zhang, Ziyu
;
Tan, Jibo
;
Wu, Xinqiang
;
Han, En-Hou
  |  
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2023/05/09
FeCrAl fuel cladding
Corrosion behavior
Crud deposition
Zn injection
Subcooled nuclear boiling
Corrosion release behavior of alloy 690 and its application in high-temperature water with Zn injection
期刊论文
OAI收割
NUCLEAR ENGINEERING AND TECHNOLOGY, 2022, 卷号: 54, 期号: 3, 页码: 984-990
作者:
Liao, Jiapeng
;
Hu, Yousen
;
Li, Jinggang
;
Jin, Desheng
;
Meng, Shuqi
  |  
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2022/07/01
Zn-injection
Nickel-based alloy
High-temperature water
Corrosion release
Characterization of ZnO/Mg0.12Zn0.88O heterostructure grown by plasma-assisted molecular beam epitaxy (EI CONFERENCE)
会议论文
OAI收割
13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004, 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004
Lu Y. M.
;
Wu C. X.
;
Wei Z. P.
;
Zhang Z. Z.
;
Zhao D. X.
;
Zhang J. Y.
;
Liu Y. C.
;
Shen D. Z.
;
Fan X. W.
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2013/03/25
In this paper
Mg0.12Zn0.88O/ZnO heterostructures were fabricated on c-plane sapphire (Al2O3) substrates by plasma-assisted molecular beam epitaxy (P-MBE). The quality of the Mg 0.12Zn0.88O alloy thin film was characterized by X-ray diffraction (XRD) and reflection high-energy electron diffraction (RHEED). Optical properties of the Mg0.12Zn0.88O/ZnO heterostructure were studied by absorption and photoluminescence (PL) spectra. At room temperature (RT)
Mg0.12Zn0.88O/ZnO heterostructures show two absorption edges originating from ZnO and Mg 0.12Zn0.88O layers
respectively. In PL spectra
two ultraviolet emission bands related to the ZnO layer and the Mg 0.12Zn0.88O layer were observed. The emission band from Mg0.12Zn0.88O layer dominates at moderately lower temperature
and the luminescence of ZnO becomes gradually important with increasing temperature. This is suggested to exist as a potential barrier in the interface and to restrict the relaxation of the carriers from the Mg 0.12Zn0.88O layer to ZnO layer. As the thickness of ZnO layer decreases
the emission from the Mg0.12Zn0.88O layer becomes weaker and weaker. When the ZnO thickness is up to 2 nm
only the luminescence of the ZnO layer is observed at RT. The quenching of the emission corresponding to the MgZnO layer indicates the existence of a strong injection process in the samples with thinner ZnO layer. 2005 Elsevier B.V. All rights reserved.
Oscillating magnetoresistance in diluted magnetic semiconductor barrier structures
期刊论文
OAI收割
physical review b, 2002, 卷号: 65, 期号: 11, 页码: art.no.115209
Chang K
;
Xia JB
;
Peeters FM
收藏
  |  
浏览/下载:212/41
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提交时间:2010/08/12
ELECTRICAL SPIN INJECTION
ZNSE/ZN1-XMNXSE HETEROSTRUCTURE
POLARIZED TRANSPORT
QUANTUM-WELLS
SCATTERING
INTERFACE
DEVICE