中国科学院机构知识库网格系统: 检索

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	Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains 期刊论文 OAI收割 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2011, 卷号: 30, 期号: 3, 页码: 455-463 作者: Wu, Shianling; Wang, Laung-Terng; Wen, Xiaoqing; Jiang, Zhigang; Tan, Lang \| 收藏 \| 浏览/下载：11/0 \| 提交时间：2019/12/16 Aligned launch-on-capture at-speed scan testing double-capture hybrid launch-on-capture launch-on-capture one-hot launch-on-capture staggered launch-on-capture
	X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文 OAI收割 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092 作者: Li, Jia; Xu, Qiang; Hu, Yu; Li, Xiaowei \| 收藏 \| 浏览/下载：21/0 \| 提交时间：2019/12/16 At-speed scan-based testing low-power testing X-filling
	Design-for-testability features and test implementation of a giga hertz general purpose microprocessor 期刊论文 iSwitch采集 Journal of computer science and technology, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者: Wang, Da; Hu, Yu; Li, Hua-Wei; Li, Xiao-Wei 收藏 \| 浏览/下载：21/0 \| 提交时间：2019/05/10 Microprocessor design-for-testability Test generation Built-in self-test At-speed testing
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 OAI收割 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者: Wang, Da; Hu, Yu; Li, Hua-Wei; Li, Xiao-Wei \| 收藏 \| 浏览/下载：19/0 \| 提交时间：2019/12/16 microprocessor design-for-testability test generation built-in self-test at-speed testing
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 OAI收割 Journal of Computer Science and Technology, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者: Da Wang(王达); Yu Hu(胡瑜); Hua-Wei Li(李华伟); Xiao-Wei Li(李晓维) \| 收藏 \| 浏览/下载：21/0 \| 提交时间：2010/11/02 Microprocessor Design-for-testability Test Generation Built-in Self-test At-speed Testing