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	Alternating stress dynamics analysis of harmonic gear flexible wheel (EI CONFERENCE) 会议论文 OAI收割 2012 International Conference on Electrical Insulating Materials and Electrical Engineering, EIMEE 2012, May 25, 2012 - May 27, 2012, Shenyang, Liaoning, China 作者: Li M. 收藏 \| 浏览/下载：41/0 \| 提交时间：2013/03/25 This article is the study of alternating stress of flexible wheel in harmonic gear drive system. Firstly then Finally according to elasticity theory to theoretically analyze flexible wheel stress based on the basic principle of sub-structure modal synthesis method based on the dynamics simulation use the software of UG to analyze the alternating stress simulation results of flexible wheel and compare theoretical results and simulation results to come conclusion. The results show that: altering stress simulation results of flexible wheel are coincident with theoretical simulation results PATRAN and ADAMS to carry out co-simulation have a deeper understand the stress change trend in the drive process of flexible wheel lay a foundation for further carrying out dynamics simulation of harmonic gear drive system. (2012) Trans Tech Publications Switzerland.
	The research on statistical properties of TDI-CCD imaging noise (EI CONFERENCE) 会议论文 OAI收割 International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, May 24, 2011 - May 26, 2011, Beijing, China Gu Y.-Y.; Shen X.-H.; He G.-X. 收藏 \| 浏览/下载：23/0 \| 提交时间：2013/03/25 TDI-CCD can improve the sensitivity of space camera without any degradation of spatial resolution which is widely used in aerospace imaging devices. The article describes the basic working principle and application characteristics of TDI-CCD devices analyses the composition of TDI-CCD imaging noise and propose a new method to analyze TDI-CCD imaging noise with statistical probability distribution. In order to estimate the distribution of gray values affect by noise we introduced the concept of skewness and kurtosis. We design an experiment using constant illumination light source take image with TDI-CCD working at different stage such as stage 16 stage 32 stage 48 stage 64 and stage 96 analyse the characteristics of image noise with the method we proposed experimental results show that the gray values approximately meet normal distribution in large sample cases. 2011 SPIE.
	High resolution gray-scale modulation method based on linear superposition for LED displays (EI CONFERENCE) 会议论文 OAI收割 2011 International Conference on Control, Automation and Systems Engineering, CASE 2011, July 30, 2011 - July 31, 2011, Singapore, Singapore Feng Y.; Xu X.; Miao C.; Ding T. 收藏 \| 浏览/下载：12/0 \| 提交时间：2013/03/25 This paper proceeds a new method for gray-scale modulation has a deep research on weighted linear superposition principle of pulse width sequences builds a basic equation of scanning drive analyzes constraint relations between compound modes of pulse sequences and gray-scale resolution pixel driving efficiency data shifting clock and refresh rate etc and optimal methods and lists parameter optimal values in different scanning ways according to real needs of LED displays resulting in realization of gray-scale modulation in 14bit to 18 bit resolution. 2011 IEEE.
	Test of an off-axis asphere by subaperture stitching interferometry (EI CONFERENCE) 会议论文 OAI收割 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China 作者: Zheng L.-G.; Zhang X.-J.; Zhang Z.-Y.; Zhang Z.-Y.; Deng W.-J. 收藏 \| 浏览/下载：54/0 \| 提交时间：2013/03/25 A new method combined subaperture stitching with interferometry(SSI) is introduced. It can test large and off-axis aspheric surfaces without the aid of other null optics. In this paper the basic principle and theory of the technique are analyzed. The synthetical optimization stitching model and effective stitching algorithm are established based on homogeneous coordinates transformation and simultaneous least-squares method. The software of SSI is devised and the prototype for testing of large aspheres by SSI is designed and developed. An off-axis asphere with the aperture of 376mm188mm is tested by this method. For comparison and validation and the difference of PV and RMS error between them is 0.047 e and 0.006 e the asphere is also tested by null compensation.The synthesized surface profile is consistent to that ofthe entire surface from null test respectively. So it provides another quantitative measurement for testing large aspheric surfaces and off-axis aspheres besides null-compensation. 2009 SPIE.
	Annular sub-aperture stitching interferometry for testing of large asphreical surfaces (EI CONFERENCE) 会议论文 OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者: Zheng L.-G.; Zhang X.-J.; Deng W.-J.; Wang X.-K. 收藏 \| 浏览/下载：79/0 \| 提交时间：2013/03/25 Annular subaperture stitching interferometric technology can test large-aperture and the PV and RMS of residual error of the full aperture phase distribution is 0.027 and 0.0023 high numerical aperture aspheric surfaces with high resolution the relative error of PV and RMS is -0.53% and -0.31% respectively. The results conclude that this splicing model and algorithm are accurate and feasible. So it provides another quantitive measurement for test aspheric surfaces especially for large aperture aspheres besides null-compensation. low cost and high efficiency without auxiliary null optics. In this paper the basic principle and theory of the stitching method are introduced the reasonable mathematical model and effective splicing algorithm are established based on simultaneous least-squares method and Zernike polynomial fitting. The translation errors are eliminated from each subaperture through the synthetical optimization stitching mode it keeps the error from transmitting and accumulating. The numerical simulations have been carried on by this method. As results the surface map of the full aperture after stitching is consistent to the input surface map the difference of PV error and RMS error between them is -0.0074 and -0.00052 ( is 632.8nm) respectively
	Features and states of microscopic particles in nonlinear quantum-mechanics systems 期刊论文 OAI收割 Frontiers of Physics in China, 2008, 卷号: 3, 期号: 2, 页码: 205-237 X. F. Pang 收藏 \| 浏览/下载：20/0 \| 提交时间：2012/04/13 microscopic particle nonlinear systems nonlinear quantum mechanics basic principle motion rule dynamic property nonlinear Schrodinger equation
	Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE) 会议论文 OAI收割 Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006, Xinjiang, China 作者: Zhang Y.; Wang X.; Wang X.; Wang X.; Wang L. 收藏 \| 浏览/下载：31/0 \| 提交时间：2013/03/25 Reference level involute is used for evaluating other involutes but it is very difficult to measure reference level involute exactly. Nowadays the available methods for measuring precise involute include single base disc mode electronic generation mode and CNC three-coordinate mode. But measurement accuracy of the modes above is not suitable for reference level involute. A precise instrument for measuring reference level involute double base discs instrument is introduced. It is consistent with generation principle of the involute entirely. Besides having the advantages of single basic disc instrument the instrument can remove Abbe error caused by the stylus and has no pressure deforming. The instrument's structure is described. The main sources of measurement errors are analyzed and methods for compensation are presented. Finally uncertainty of the instrument is given which meets reference level involute test specification.
	Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Zhou C.; Li H.; Chen C.; Zhou C.; Qian S. 收藏 \| 浏览/下载：36/0 \| 提交时间：2013/03/25 Profile error of super smooth surface of optical elements at X-ray/EUV in synchrotron radiation (SR) light beam line is described as slope error of them generally. The Long Trace Profiler (LPT) is used for testing surface slope error of SR optical elements in world generally. It is requisite to use In-suit LTP measuring surface thermal distortion of SR optical elements with high heat under high bright SR source. Authors design an In-suit LTP by means of co-path interferometer with pencil light beam. The instrument not only can be used for testing slope error of mirrors in Lab. also in situation test the distortion of mirror with high heat load at synchrotron light beam line. The device can be used to test various absolute surface figures of optical elements such as aspherieal spherical and plane. It is needless standard reference surface. It is named by LTP-III. This paper describes its basic operating principle optical system mechanical constructions DC serve motor control system array detector data acquisition system and computer system for controlling and data analysis of LTP-III. The Instrument has advantages of high accuracy low cost multifunction and wide application. Length of surface measured of optical element accuracy is 0.04 arcsec.