中国科学院机构知识库网格系统: 检索

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	宏观生态系统科学理论研究和实践应用知识体系的构建期刊论文 OAI收割应用生态学报, 2025, 卷号: N/A, 期号: 0, 页码: 1-13 作者: 于贵瑞; 于宗绪; 王秋凤; 郝天象; 杨萌 \| 收藏 \|
	Alternating stress dynamics analysis of harmonic gear flexible wheel (EI CONFERENCE) 会议论文 OAI收割 2012 International Conference on Electrical Insulating Materials and Electrical Engineering, EIMEE 2012, May 25, 2012 - May 27, 2012, Shenyang, Liaoning, China 作者: Li M. 收藏 \|
	The research on statistical properties of TDI-CCD imaging noise (EI CONFERENCE) 会议论文 OAI收割 International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, May 24, 2011 - May 26, 2011, Beijing, China Gu Y.-Y.; Shen X.-H.; He G.-X. 收藏 \|
	High resolution gray-scale modulation method based on linear superposition for LED displays (EI CONFERENCE) 会议论文 OAI收割 2011 International Conference on Control, Automation and Systems Engineering, CASE 2011, July 30, 2011 - July 31, 2011, Singapore, Singapore Feng Y.; Xu X.; Miao C.; Ding T. 收藏 \|
	Test of an off-axis asphere by subaperture stitching interferometry (EI CONFERENCE) 会议论文 OAI收割 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China 作者: Zheng L.-G.; Zhang X.-J.; Zhang Z.-Y.; Zhang Z.-Y.; Deng W.-J. 收藏 \|
	Annular sub-aperture stitching interferometry for testing of large asphreical surfaces (EI CONFERENCE) 会议论文 OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者: Zheng L.-G.; Zhang X.-J.; Deng W.-J.; Wang X.-K. 收藏 \|
	Features and states of microscopic particles in nonlinear quantum-mechanics systems 期刊论文 OAI收割 Frontiers of Physics in China, 2008, 卷号: 3, 期号: 2, 页码: 205-237 X. F. Pang 收藏 \|
	Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE) 会议论文 OAI收割 Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006, Xinjiang, China 作者: Zhang Y.; Wang X.; Wang X.; Wang X.; Wang L. 收藏 \|
	Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Zhou C.; Li H.; Chen C.; Zhou C.; Qian S. 收藏 \|