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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
长春光学精密机械与物... [5]
高能物理研究所 [2]
采集方式
OAI收割 [7]
内容类型
会议论文 [5]
期刊论文 [2]
发表日期
2010 [3]
2009 [1]
2006 [2]
2005 [1]
学科主题
Physics [1]
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Design of co-path scanning long trace profiler for measurement of X-ray space optical elements (EI CONFERENCE)
会议论文
OAI收割
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
Shun L.
;
Yan G.
;
Wei Z.
;
Yang Z.
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2013/03/25
The Long Trace Profiler (LTP) is a precision surface slope error measurement instrument used in synchrotron radiation optics for many years. By making some modifications to the LTP system
we developed a co-path scanning LTP (CSLTP) system to test the cylindrical aspherical surface which used in X-ray space optics. To reduce the mistake caused by air turbulence and manufacture faults of optical elements used
the CSLTP is designed with the least difference between the testing beam path and the reference beam path. Also
it uses multiple-beam interference but double beam interference to reduce the width of beam fringe. This improves the position precision of the beam fringe on the image plane. 2010 SPIE.
BEPC II wire scanner system
期刊论文
OAI收割
CHINESE PHYSICS C, 2010, 卷号: 34, 期号: 10, 页码: 1661-1664
作者:
Sui YF(随艳峰)
;
Wang L(汪林)
;
Zhao Y(赵颖)
;
Yue JH(岳军会)
;
Li XP(李小平)
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2016/06/29
BEPC II
beam instrument
beam profile
wire-scanner
BEPCII wire scanner system
期刊论文
OAI收割
中国物理C, 2010, 期号: 10, 页码: 1661-1664
作者:
Sui YF(随艳峰)
;
Wang L(汪林)
;
Zhao Y(赵颖)
;
Yue JH(岳军会)
;
Li XP(李小平)
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2015/12/14
BEPC beam instrument
beam profile
wire-scanner
A sensitive solid-phase time-resolved fluorescence immunoassay apparatus (EI CONFERENCE)
会议论文
OAI收割
International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, June 17, 2009 - June 19, 2009, Beijing, China
作者:
Song K.-F.
;
Li J.-L.
;
Zhang W.-L.
;
Wang Y.-L.
收藏
  |  
浏览/下载:37/0
  |  
提交时间:2013/03/25
In the device
a He-Ne laser of flash frequency 1-20 Hz was adopted as exciting light source
and three key technical problems have been solved successfully in order to enhance the detecting sensitivity and measuring stability of the device for time-resolved fluorimmunoassays(TRFIA) [1]. The first one is to design optimum exciting optical system
so that the exciting light beam excite the sample most effectively. The second one is to have a project spectrum filter which can reduce the affection of the background light to the photomultiplier tube and also ensure influence of the stray light and mixed diffusion light to the sample fluorescence to the least
the sample fluorescence through the integrating sphere and come to the grating monochromator
The right wavelength will be chosed through changing the angle of incidence of the grating monochromator. The third one is to simulate the principle of sample averaging of BOXCAR averager. In the device
SCM was used as primary controller and CPLD was used as timing controller. Through the preparation process
signal-to-noise ratio(SNR) will be improved
also adjust delay time
ampling frequency and sampling number arbitrarily. By testing
the sensitivity is 10-12mol/L(substance marked by Eu3+)
examination repeat is &le2.5%
examination linearity is from 10 -8mol/L to 10-12mol/L
correlation coefficient is 99.98%(p&le0.01). The instrument is advanced for ultrasensitive detection of antigen and antibody
and solve the tumor
genetic variation
the virus protein detection. 2009 SPIE.
Development of a new diffuse near infrared food measuring (EI CONFERENCE)
会议论文
OAI收割
Sitxh International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, October 13, 2006 - October 15, 2006, Beijing, China
作者:
Zhang J.
;
Zhang J.
;
Zhang J.
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2013/03/25
Industries from agriculture to petrochemistry have found near infrared (NIR) spectroscopic analysis useful for quality control and quantitative analysis of materials and products. The general chemical
polymer chemistry
petrochemistry
agriculture
food and textile industries are currently using NIR spectroscopic methods for analysis. In this study
we developed a new sort NIR instrument for food measuring. The instrument consists of a light source
12 filters to the prismatic part. The special part is that we use a mirror to get two beams of light. And two PbS detectors were used. One detector collected the radiation of one light beam directly and the value was set as the standard instead the standard white surface. Another light beam irradiate the sample surface
and the diffuse light was collected by another detector. The value of the two detectors was compared and the absorbency was computed. We tested the performance of the NIR instrument in determining the protein and fat content of milk powder. The calibration showed the accuracy of the instrument in practice.
The full hemisphere integrating measurement of the reflectance of black cavity (EI CONFERENCE)
会议论文
OAI收割
ICO20: Illumination, Radiation, and Color Technologies, August 21, 2005 - August 26, 2005, Changchun, China
作者:
Wang Y.
;
Yu B.
;
Wang Y.
;
Wang Y.
;
Wang Y.
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2013/03/25
The conical black cavities are used in the Solar Irradiance Absolute Radiometers (SIARs) of the solar constant monitor aboard on the SZ spaceship and of the Solar Total Irradiance Monitor (STIM) aboard on sun-synchronous polar orbit weather satellites. A low reflectance measurement instrument which is used for making the integrating measurement on the reflectance of the conical black cavity in a high precision within the full hemisphere (include the entrance of the Ulbrichtsphere) has been constructed. The characteristic of the instrument is the employment of a semi-transparent mirror
which is mounted in an inclination angle of 45 degrees in front of the entrance of the Ulbrichtsphere. The incident beam is reflected to the black cavity or white board by the semi-transparent mirror. A portion of those
which is made diffused reflection through the black cavity or white board
is measured by the detector located in the side face of the Ulbrichtsphere
and the other portion which is reflected to the entrance is measured by the other detector
after passing through the semi-transparent mirror
and then being focused on by an ellipsoidal mirror. The two measurement data are added up to get the integrating reflectance within full hemisphere. The presentation and verification on the measurement result of the reflectance of the black cavity and its precision are described in this article. The absolute accuracy can reach 0.012%.
Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE)
会议论文
OAI收割
ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China
Zhou C.
;
Li H.
;
Chen C.
;
Zhou C.
;
Qian S.
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2013/03/25
Profile error of super smooth surface of optical elements at X-ray/EUV in synchrotron radiation (SR) light beam line is described as slope error of them generally. The Long Trace Profiler (LPT) is used for testing surface slope error of SR optical elements in world generally. It is requisite to use In-suit LTP measuring surface thermal distortion of SR optical elements with high heat under high bright SR source. Authors design an In-suit LTP by means of co-path interferometer with pencil light beam. The instrument not only can be used for testing slope error of mirrors in Lab. also in situation test the distortion of mirror with high heat load at synchrotron light beam line. The device can be used to test various absolute surface figures of optical elements such as aspherieal
spherical and plane. It is needless standard reference surface. It is named by LTP-III. This paper describes its basic operating principle
optical system
mechanical constructions
DC serve motor control system
array detector
data acquisition system and computer system for controlling and data analysis of LTP-III. The Instrument has advantages of high accuracy
low cost
multifunction and wide application. Length of surface measured of optical element accuracy is 0.04 arcsec.