机构

• 自动化研究所 [36]
• 沈阳自动化研究所 [3]
• 合肥物质科学研究院 [3]
• 计算技术研究所 [2]
• 上海光学精密机械研究... [2]
• 西安光学精密机械研究... [2]
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采集方式

• OAI收割 [52]

内容类型

• 期刊论文 [41]
• 会议论文 [7]
• 学位论文 [4]

发表日期

• 2025 [2]
• 2024 [8]
• 2023 [4]
• 2022 [8]
• 2021 [11]
• 2020 [2]
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学科主题

• 光学工程 [2]

筛选

浏览/检索结果: 共52条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 IDD-YOLOv7: A lightweight and efficient feature extraction method for insulator defect detection 期刊论文  OAI收割 ENERGY REPORTS, 2025, 卷号: 13, 页码: 1467-1487 作者:  Zhao, Yongxiang;  Zhang, Guoqing;  Luo, Wei;  Tang, Ruiyin;  Sun, Ying   |  收藏  |  浏览/下载：7/0  |  提交时间：2025/03/31 Insulator defect detection  Lightweight model  Efficient feature extraction  IDD-YOLOv7   Improved YOLO v5s-based detection method for external defects in potato 期刊论文  OAI收割 FRONTIERS IN PLANT SCIENCE, 2025, 卷号: 16, 页码: 15 作者:  Li, Xilong;  Wang, Feiyun;  Guo, Yalin;  Liu, Yijun;  Lv, Huangzhen   |  收藏  |  浏览/下载：28/0  |  提交时间：2025/04/07 potato  external defect  object detection  YOLO v5s  deep learning   A fine-tuned multimodal large model for power defect image-text question-answering 期刊论文  OAI收割 SIGNAL IMAGE AND VIDEO PROCESSING, 2024 作者:  Wang, Qiqi;  Zhang, Jie;  Du, Jianming;  Zhang, Ke;  Li, Rui   |  收藏  |  浏览/下载：11/0  |  提交时间：2024/11/20 Power system  Defect detection  Multimodal large model  LoRA  Q-former   A Flexible and Accurate Additive Manufacturing Data Retrieval Method Based on Probabilistic Modeling and Transformation-Invariant Feature Learning 期刊论文  OAI收割 JOURNAL OF COMPUTING AND INFORMATION SCIENCE IN ENGINEERING, 2024, 卷号: 24, 期号: 8, 页码: 15 作者:  Fang, Qihang;  Xiong, Gang;  Wang, Weixing;  Shen, Zhen;  Dong, Xisong   |  收藏  |  浏览/下载：7/0  |  提交时间：2024/09/09 additive manufacturing  database  process planning  defect detection  laser powder bed fusion  vat photopolymerization   Automatic Defect Detection Instrument for Spherical Surfaces of Optical Elements 期刊论文  OAI收割 PHOTONICS, 2024, 卷号: 11, 期号: 7, 页码: 13 作者:  Shi, Yali;  Zhang, Mei;  Li, Mingwei   |  收藏  |  浏览/下载：7/0  |  提交时间：2024/09/09 computer vision  defect detection  spherical optical element   Surface defect detection and semantic segmentation with a novel lightweight deep neural network 期刊论文  OAI收割 Measurement Science and Technology, 2024, 卷号: 35, 期号: 8, 页码: 14 作者:  Huang,Qiang;  Li,Fudong;  Yang,Yuequan;  Tao,Xian;  Li,Wei   |  收藏  |  浏览/下载：15/0  |  提交时间：2024/07/03 deep learning  surface defect detection  semantic segmentation  lightweight network   Enhancing Representation Power of Deep Neural Networks With Negligible Parameter Growth for Industrial Applications 期刊论文  OAI收割 IEEE TRANSACTIONS ON SYSTEMS MAN CYBERNETICS-SYSTEMS, 2024, 页码: 12 作者:  Chen, Liangming;  Jin, Long;  Shang, Mingsheng;  Wang, Fei-Yue   |  收藏  |  浏览/下载：20/0  |  提交时间：2024/05/30 Residual neural networks  Vectors  Noise  Biological neural networks  Medical services  Defect detection  Agriculture  Deep neural networks (DNNs)  industrial applications  ordinary differential equation (ODE)  representation power   Attention-Based Multiscale Feature Fusion for Efficient Surface Defect Detection 期刊论文  OAI收割 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2024, 卷号: 73, 页码: 10 作者:  Zhao, Yuhao;  Liu, Qing;  Su, Hu;  Zhang, Jiabin;  Ma, Hongxuan   |  收藏  |  浏览/下载：4/0  |  提交时间：2024/07/03 Attention mechanism  feature enhancement  feature fusion  object detection  surface defect detection   Industry-oriented Detection Method of PCBA Defects Using Semantic Segmentation Models 期刊论文  OAI收割 IEEE/CAA Journal of Automatica Sinica, 2024, 卷号: 11, 期号: 6, 页码: 1438-1446 作者:  Yang Li;  Xiao Wang;  Zhifan He;  Ze Wang;  Ke Cheng   |  收藏  |  浏览/下载：13/0  |  提交时间：2024/05/22 Automated optical inspection (AOI)  deep learning  defect detection  printed circuit board assembly (PCBA)  semantic segmentation   Deep Industrial Image Anomaly Detection: A Survey 期刊论文  OAI收割 Machine Intelligence Research, 2024, 卷号: 21, 期号: 1, 页码: 104-135 作者:  Jiaqi Liu;  Guoyang Xie;  Jinbao Wang;  Shangnian Li;  Chengjie Wang   |  收藏  |  浏览/下载：6/0  |  提交时间：2024/04/23 Image anomaly detection, defect detection, industrial manufacturing, deep learning, computer vision