机构

• 计算技术研究所 [2]
• 长春光学精密机械与物... [2]
• 自动化研究所 [1]

采集方式

• OAI收割 [5]

内容类型

• 期刊论文 [3]
• 会议论文 [2]

发表日期

• 2011 [3]
• 2009 [1]
• 2000 [1]

学科主题

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Path Delay Test generation Toward Activation of worst Case Coupling Effects 期刊论文  OAI收割 IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982 作者:  minjin, zhang;  Huawei, Li;  Xiaowei,Li   |  收藏  |   Path Delay Test Generation Toward Activation of Worst Case Coupling Effects 期刊论文  OAI收割 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982 作者:  Zhang, Minjin;  Li, Huawei;  Li, Xiaowei   |  收藏  |   Study on spectrograph for ionosphere: A broadband imaging instrument prototype for far-ultraviolet (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging 2011: Space Exploration Technologies and Applications, May 24, 2011 - May 26, 2011, Beijing, China 作者:   收藏  |   A sensitive solid-phase time-resolved fluorescence immunoassay apparatus (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, June 17, 2009 - June 19, 2009, Beijing, China 作者:  Song K.-F.;  Li J.-L.;  Zhang W.-L.;  Wang Y.-L. 收藏  |   Reduction of number of paths to be tested in delay testing 期刊论文  OAI收割 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2000, 卷号: 16, 期号: 5, 页码: 477-485 作者:  Li, HW;  Li, ZC;  Min, YH   |  收藏  |