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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
上海应用物理研究所 [3]
苏州纳米技术与纳米仿... [1]
长春光学精密机械与物... [1]
沈阳自动化研究所 [1]
上海光学精密机械研究... [1]
长春应用化学研究所 [1]
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OAI收割 [8]
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期刊论文 [7]
会议论文 [1]
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2020 [1]
2019 [2]
2013 [1]
2011 [1]
2006 [2]
2000 [1]
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Spectrosco... [1]
光学材料;晶体 [1]
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DNA-Based Fabrication for Nanoelectronics
期刊论文
OAI收割
NANO LETTERS, 2020, 卷号: 20, 期号: 8, 页码: 5604-5615
作者:
Dai, XP
;
Li, Q
;
Aldalbahi, A
;
Wang, LH
;
Fan, CH
  |  
收藏
  |  
浏览/下载:42/0
  |  
提交时间:2021/09/06
PROBE FORCE MICROSCOPY
ELECTRICAL CHARACTERIZATION
BLOCK-COPOLYMER
LABEL-FREE
CHARGE
SINGLE
NANOWIRES
RESOLUTION
METAL
MOLECULES
Fifteen years of Servitude et Grandeur to the application of a biophysical technique in medicine: The tale of AFMBioMed
期刊论文
OAI收割
JOURNAL OF MOLECULAR RECOGNITION, 2019, 卷号: 32, 期号: 3, 页码: —
作者:
Pellequer, JL
;
Parot, P
;
Navajas, D
;
Kumar, S
;
Svetlicic, V
  |  
收藏
  |  
浏览/下载:120/0
  |  
提交时间:2019/12/30
ATOMIC-FORCE MICROSCOPY
AFM-BIOMED-CONFERENCE
LIFE SCIENCES
NANOMECHANICAL CHARACTERIZATION
FLUORESCENCE MICROSCOPY
MECHANICAL-PROPERTIES
LIPID-BILAYERS
PROTEIN-DNA
SINGLE
CELL
Atomic force microscopy in probing tumor physics for nanomedicine
期刊论文
OAI收割
IEEE Transactions on Nanotechnology, 2019, 卷号: 18, 页码: 83-113
作者:
Li M(李密)
;
Wang YC(王越超)
;
Liu LQ(刘连庆)
  |  
收藏
  |  
浏览/下载:49/0
  |  
提交时间:2018/12/16
atomic force microscopy
physical oncology
nanomedicine
cell mechanics
molecular recognition
tissue characterization
Dynamics Analysis and Motion Planning for Automated Cell Transportation With Optical Tweezers
期刊论文
OAI收割
IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2013, 卷号: 18, 期号: 2, 页码: 706-713
Wu, YH(吴玉华)
;
Sun, D
;
Huang, WH
;
Xi, N
收藏
  |  
浏览/下载:42/0
  |  
提交时间:2014/01/13
Cell transportation
force characterization
motion plan
optical tweezers
Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE)
会议论文
OAI收割
2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China
作者:
Chen B.
;
Chen B.
收藏
  |  
浏览/下载:46/0
  |  
提交时间:2013/03/25
A grazing incidence x-ray scattering (XRS) method
Order perturbation theory (FOPT)
is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced
which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree
as the x-ray wavelength is 0.154 nm
have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison
the root mean square (RMS) surface roughness
grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM
which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.
Growth and properties of ZnO thin film on beta-Ga2O3(100) substrate by pulsed laser deposition
期刊论文
OAI收割
JOURNAL OF CRYSTAL GROWTH, 2006, 卷号: 296, 期号: 2, 页码: 186
Zhang, JG
;
Li, B(李宾)
;
Xia, CT
;
Deng, Q
;
Xu, J
;
Pei, GQ
;
Wu, F
;
Wu, YQ
;
Shi, HS
;
Xu, WS
;
Yang, ZH
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2012/05/03
atomic force microscopy
characterization
floating zone technique
laser epitaxy
zinc compounds
semiconducting materials
Growth and properties of ZnO thin film on beta-Ga2O3(100) substrate by pulsed laser deposition
期刊论文
OAI收割
j. cryst. growth, 2006, 卷号: 296, 期号: 2, 页码: 186, 190
Zhang Jungang
;
Li Bin
;
夏长泰
;
Deng Qun
;
徐军
;
裴广庆
;
Wu Feng
;
Wu Yongqing
;
Shi Hongsheng
;
Xu Wusheng
;
Yang Zhaohui
收藏
  |  
浏览/下载:2030/242
  |  
提交时间:2009/09/24
atomic force microscopy
characterization
floating zone technique
laser epitaxy
zinc compounds
semiconducting materials
Self-assembled monolayer of polyoxometalate on gold surfaces: Quartz crystal microbalance, electrochemistry, and in-situ scanning tunneling microscopy study
期刊论文
OAI收割
langmuir, 2000, 卷号: 16, 期号: 11, 页码: 4946-4952
Tang ZY
;
Liu SQ
;
Wang EK
;
Dong SJ
收藏
  |  
浏览/下载:189/39
  |  
提交时间:2010/11/04
CHEMICALLY MODIFIED ELECTRODES
SODIUM DECATUNGSTOCERATE IV
SULFUR-CONTAINING MOLECULES
ATOMIC-FORCE MICROSCOPY
ORGANIC-SURFACES
STRUCTURAL CHARACTERIZATION
INFRARED-SPECTROSCOPY
THIOL MONOLAYERS
ANION ADSORPTION
SINGLE-CRYSTAL