中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
采集方式
内容类型
发表日期
学科主题
筛选

浏览/检索结果: 共6条,第1-6条 帮助

条数/页: 排序方式:
Geometrical characteristic investigation of the Baihetan irregular columnar jointed basalt and corresponding numerical reconstruction method 期刊论文  OAI收割
JOURNAL OF CENTRAL SOUTH UNIVERSITY, 2022, 卷号: 29, 期号: 2, 页码: 455
作者:  
Zhang, Jian-cong;  Jiang, Quan;  Feng, Guang-liang;  Li, Shao-jun;  Pei, Shu-feng
  |  收藏  |  浏览/下载:12/0  |  提交时间:2023/08/02
Comparison of Substrate Preheating on Mechanical and Microstructural Properties of Hybrid Specimens Fabricated by Laser Metal Deposition 316 L with Different Wrought Steel Substrate 期刊论文  OAI收割
CRYSTALS, 2020, 卷号: 10, 期号: 10, 页码: 1-15
作者:  
Zhao YH(赵宇辉);  Wang ZG(王志国);  Zhao JB(赵吉宾);  He ZF(何振丰);  Zhang HW(张宏伟)
  |  收藏  |  浏览/下载:29/0  |  提交时间:2020/11/28
Geometrical and Geotechnical Characteristics of Landslides in Korea under Various Geological Conditions 期刊论文  OAI收割
Journal of Mountain Science, 2015, 卷号: 12, 期号: 5, 页码: 1267-1280
作者:  
Kyeong-Su KIM;  Young-Suk SONG
收藏  |  浏览/下载:30/0  |  提交时间:2015/09/22
A new algorithm of image segmentation for overlapping grain image (EI CONFERENCE) 会议论文  OAI收割
ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005, Changchun, China
作者:  
Zhang X.;  Zhang X.;  Zhang X.
收藏  |  浏览/下载:17/0  |  提交时间:2013/03/25
Image segmentation is primary issue in image processing  at the same time it is principal problem in low level vision in computer vision field. It is the key technology to process image analysis  image comprehend and image depict successfully. Aim at measurement of granularity size of nonmetal grain  a new algorithm of image segmentation and parameters calculation for overlapping grain image is studied. The hypostasis of this algorithm is present some new attributes of graph sequence from discrete attribute of graph  consequently achieve that pick up the geometrical characteristics from input graph  and new graph sequence which in favor of image segmentation is recombined. The conception that image edge denoted with "twin-point" is put forward  base on geometrical characters of point  image edge is transformed into serial edge  and on recombined serial image edge  based on direction vector definition of line and some additional restricted conditions  the segmentation twin-points are searched with  thus image segmentation is accomplished. Serial image edge is transformed into twin-point pattern  to realize calculation of area and granularity size of nonmetal grain. The inkling and uncertainty on selection of structure element which base on mathematical morphology are avoided in this algorithm  and image segmentation and parameters calculation are realized without changing grain's self statistical characters.  
Geometrical modulation transfer function of different active pixel of CMOS APS (EI CONFERENCE) 会议论文  OAI收割
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005, Zian, China
作者:  
Li J.;  Liu J.;  Liu J.;  Liu J.;  Li J.
收藏  |  浏览/下载:25/0  |  提交时间:2013/03/25
The geometrical Modulation Transfer Function (MTF) of CMOS APS (active pixel sensor) is analyzed in this paper. Advanced APS have been designed and fabricated where different pixel shapes such as square  rectangle and L shape  were placed  because the amplifier circuit and other function circuits inter pixel of APS take up some pixel area. MTF is an important figure of merit in focal plane array imaging sensors. Research on analyzing the MTF for the proper pixel shape is currently in progress for a centroidal configuration of a target position. MTF will give us a more complete understanding of the tradeoffs opposed by the different pixel designs and by the signal processing conditions. Based on image sensor sampling and reconstructing model  the MTF expression of any active pixel shape has been deduced in this paper. According to actual pixel shape  three different active area pixels were analyzed  they were square  rectangle  and L shape  their Fill Factor (FF) is 30%  44% and 55%  respectively. Results of simulation experiments indicate that different pixel geometrical characteristics contribute significantly to the figures of their MTF. Different geometrical shape of active sensitive area of pixel and different station in pixel would influence MTF figures. The analysis results are important in designing better APS pixel and more important in analyzing imaging system performance of APS subpixel precision system.  
Active pixel sensor geometrical characteristic effects on star image subdivided locating accuracy for star tracker (EI CONFERENCE) 会议论文  OAI收割
ICO20: Remote Sensing and Infrared Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China
作者:  
Liu J.;  Liu J.;  Liu J.;  Li J.;  Li J.
收藏  |  浏览/下载:27/0  |  提交时间:2013/03/25
Active pixel sensor (APS) star tracker becomes an investigated hotspot because of its technical advantages. And centroid algorithm is a subpixel method proper to star position calculation because of its high accuracy and simplicity. When centroid algorithm is applied on APS star tracker  APS pixel geometrical characteristics might effect on star image position accuracy. Because the amplifier circuit and other function circuits inter pixel of APS take up some pixel area  the Fill Factor is less than 100%. Moreover  the active sensitive area has a certain geometrical shape  such as square  rectangle and L shape. The Fill Factor of pixel influences on star image subdivided locating accuracy when using centioid algorithm. In this paper  we have analyzed all pixel geometrical characteristics influence on the star position accuracy. From simulation experiments  we can conclude that Fill factor and pixel geometric shape influence on star position accuracy. The star locating error increased when Fill Factor decreased  and different geometrical shape of active sensitive area of pixel can make different influence on star location accuracy  the symmetrical sensitive area in x or y axis have symmetrical location error in the same axis.