中国科学院机构知识库网格系统: 检索

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	A study on effects of total ionizing dose on hot carrier effect of PD I/O SOI PMOSFETs 期刊论文 OAI收割 RESULTS IN PHYSICS, 2019, 卷号: 13, 期号: 6, 页码: 1-5 作者: Zhao, JH (Zhao, Jinghao)[ 1,2,3 ]; Zheng, QW (Zheng, Qiwen)[ 1,2 ]; Cui, JW (Cui, Jiangwei)[ 1,2 ]; Zhou, H (Zhou, Hang)[ 1,2,3 ]; Liang, XW (Liang, Xiaowen)[ 1,2,3 ] \| 收藏 \| 浏览/下载：10/0 \| 提交时间：2020/03/20 Hot carrier effect PMOS Total ionizing dose effect
	Degradation of the front and back channels in a deep submicron partially depleted SOI NMOSFET under off-state stress 期刊论文 OAI收割 Journal of Semiconductors, 2013, 卷号: 34, 期号: 7, 页码: 074008-1-074008-6 作者: Zheng, Qiwen; Yu, Xuefeng; Cui, Jiangwei; Guo, Qi; Cong, Zhongchao 收藏 \| 浏览/下载：19/0 \| 提交时间：2014/11/11 silicon-on-insulator hot-carrier effect hump back gate
	The influence of channel size on total dose irradiation and hot-carrier effects of sub-micro NMOSFET 期刊论文 OAI收割 ACTA PHYSICA SINICA, 2012, 卷号: 61, 期号: 2, 页码: - 作者: Cui Jiang-Wei; Yu Xue-Feng; Ren Di-Yuan; Lu Jian 收藏 \| 浏览/下载：25/0 \| 提交时间：2012/11/29 sub-micro total dose irradiation hot-carrier effect
	Temperature dependence of field emission of nano-diamond 期刊论文 OAI收割 acta physica sinica, 2010, 卷号: 59, 期号: 4, 页码: 2666-2671 作者: Yang Yan-Ning; Zhang Zhi-Yong; Zhang Fu-Chun; Zhang Wei-Hu; Yan Jun-Feng 收藏 \| 浏览/下载：23/0 \| 提交时间：2015/09/16 field emission nano-diamond scale effect hot carrier
	Numerical evaluation of energy loss rate for hot carriers in quantum wells 期刊论文 OAI收割 superlattices and microstructures, 1998, 卷号: 23, 期号: 1, 页码: 87-92 Zhu BF; Huang K; Zhang JZ 收藏 \| 浏览/下载：38/0 \| 提交时间：2010/08/12 hot carrier relaxation hot phonon effect electron-phonon interaction SUPERLATTICES
	Numerical evaluation of energy loss rate for hot carriers in quantum wells 期刊论文 iSwitch采集 Superlattices and microstructures, 1998, 卷号: 23, 期号: 1, 页码: 87-92 作者: Zhu, BF; Huang, K; Zhang, JZ 收藏 \| 浏览/下载：19/0 \| 提交时间：2019/05/12 Hot carrier relaxation Hot phonon effect Electron-phonon interaction