中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
长春光学精密机械与物... [2]
合肥物质科学研究院 [2]
采集方式
OAI收割 [4]
内容类型
会议论文 [2]
期刊论文 [2]
发表日期
2024 [2]
2011 [1]
2006 [1]
学科主题
筛选
浏览/检索结果:
共4条,第1-4条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
发表日期升序
发表日期降序
Key electronic parameters of 2
H
-stacking bilayer MoS
2
on sapphire substrate determined by terahertz magneto-optical measurement in Faraday geometry
期刊论文
OAI收割
FRONTIERS OF PHYSICS, 2024, 卷号: 19
作者:
Cheng, Xingjia
;
Xu, Wen
;
Wen, Hua
;
Zhang, Jing
;
Zhang, Heng
  |  
收藏
  |  
浏览/下载:80/0
  |  
提交时间:2024/11/22
bilayer MoS2
terahertz time-domain spectroscopy
magneto-optical conductivities
key electronic parameters
effective electron mass
Key electronic parameters of 2
H
-stacking bilayer MoS
2
on sapphire substrate determined by terahertz magneto-optical measurement in Faraday geometry
期刊论文
OAI收割
FRONTIERS OF PHYSICS, 2024, 卷号: 19
作者:
Cheng, Xingjia
;
Xu, Wen
;
Wen, Hua
;
Zhang, Jing
;
Zhang, Heng
  |  
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2024/11/22
bilayer MoS2
terahertz time-domain spectroscopy
magneto-optical conductivities
key electronic parameters
effective electron mass
The sequence measurement system of the IR camera (EI CONFERENCE)
会议论文
OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, May 24, 2011 - May 24, 2011, Beijing, China
作者:
Zhang H.-B.
;
Han H.-X.
;
Geng A.-H.
收藏
  |  
浏览/下载:36/0
  |  
提交时间:2013/03/25
Currently
the IR cameras are broadly used in the optic-electronic tracking
optic-electronic measuring
fire control and optic-electronic countermeasure field
but the output sequence of the most presently applied IR cameras in the project is complex and the giving sequence documents from the leave factory are not detailed. Aiming at the requirement that the continuous image transmission and image procession system need the detailed sequence of the IR cameras
the sequence measurement system of the IR camera is designed
and the detailed sequence measurement way of the applied IR camera is carried out. The FPGA programming combined with the SignalTap online observation way has been applied in the sequence measurement system
and the precise sequence of the IR camera's output signal has been achieved
the detailed document of the IR camera has been supplied to the continuous image transmission system
image processing system and etc. The sequence measurement system of the IR camera includes CameraLink input interface part
LVDS input interface part
FPGA part
CameraLink output interface part and etc
thereinto the FPGA part is the key composed part in the sequence measurement system. Both the video signal of the CmaeraLink style and the video signal of LVDS style can be accepted by the sequence measurement system
and because the image processing card and image memory card always use the CameraLink interface as its input interface style
the output signal style of the sequence measurement system has been designed into CameraLink interface. The sequence measurement system does the IR camera's sequence measurement work and meanwhile does the interface transmission work to some cameras. Inside the FPGA of the sequence measurement system
the sequence measurement program
the pixel clock modification
the SignalTap file configuration and the SignalTap online observation has been integrated to realize the precise measurement to the IR camera. Te sequence measurement program written by the verilog language combining the SignalTap tool on line observation can count the line numbers in one frame
pixel numbers in one line and meanwhile account the line offset and row offset of the image. Aiming at the complex sequence of the IR camera's output signal
the sequence measurement system of the IR camera accurately measures the sequence of the project applied camera
supplies the detailed sequence document to the continuous system such as image processing system and image transmission system and gives out the concrete parameters of the fval
lval
pixclk
line offset and row offset. The experiment shows that the sequence measurement system of the IR camera can get the precise sequence measurement result and works stably
laying foundation for the continuous system. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).
Research of automatic test technology of parameters used in a dual-CCD TV measure-system (EI CONFERENCE)
会议论文
OAI收割
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005, Zian, China
作者:
Wang L.
;
Li Y.
;
Li Y.
;
Li Y.
;
Li Y.
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2013/03/25
This paper describes a kind of automatic test technology of the parameters used in a dual-CCD TV measure-system (TV -MS) .The TV -MS is the ground control equipment of the anti-tank missile and integrates the technologies of optical
machine and electronics. It is important and key component. The main technical parameters of the TV -MS are field of view
zero point
precision
sensitivity
anti-jamming ability
zooming time and focus time
etc. To insure the TV -MS satisfying the tactical and technical requirements and discover fault and reason
a fast and accurate equipment satisfying the test technical parameters of the TV -MS is urgently needed in manufacture and service. Firstly
the parameter test system converted optical signal to electronic signal
implemented automatic control of the invariant illumination of parallel pipeline output. Secondly
data and command delivering
displaying or printing are realized by using 80C196KB. The experiment result shows that the approach of automatic testing of the Parameters used in a dual-CCD TV -MS is successful and it can be used for all tests of the functions and parameters of the TV -MS. The main innovations are to realize the fast
veracious measure of technical parameters of the dual-CCD TV-MS
and integrate the technologies of optics
machineries and electronics. An advanced means is provided to judge the technical states
find malfunctions and discover the reasons in producing and maintaining process. The equipment suited for anti-tank missile systems is given.