中国科学院机构知识库网格系统: 检索

Baseline-free direct absorption spectroscopy and its application in line intensity measurement of ammonia 期刊论文 OAI收割
OPTICS COMMUNICATIONS, 2022, 卷号: 525
作者: Long, Jiangxiong; Zhang, Yujun; Shao, Li; You, Kun; He, Ying

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收藏 | 浏览/下载：53/0 | 提交时间：2022/12/23

Direct absorption spectroscopy Baseline-free Line intensity Ammonia

Electrostatic analysis and preliminary design of transmission line for the CRAFT NNBI test platform 期刊论文 OAI收割
FUSION ENGINEERING AND DESIGN, 2021, 卷号: 165
作者: Wang, Rixin; Jiang, Caichao; Xu, Yongjian; Xie, Yahong; Xie, Yuanlai

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收藏 | 浏览/下载：35/0 | 提交时间：2021/05/06

Negative-ion based Neutral Beam Injectors Transmission line Finite element analyses Electric field intensity Equivalent distributed capacitance

NH3 aliasing absorption spectra at 1103.4 cm(-1) based on continuous quantum cascade laser 期刊论文 OAI收割
ACTA PHYSICA SINICA, 2020, 卷号: 69
作者: Li Meng-Qi; Zhang Yu-Jun; He Ying; You Kun; Fan Bo-Qiang

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收藏 | 浏览/下载：35/0 | 提交时间：2020/11/26

laser absorption spectrum quantum cascade laser line intensity concentration inversion

Population modelling of the He II energy levels in tokamak plasmas: I. Collisional excitation model 期刊论文 OAI收割
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2019, 卷号: 52, 期号: 4, 页码: 21
作者: Lawson, K. D.; Aggarwal, K. M.; Coffey, I. H.; Keenan, F. P.; O'Mullane, M. G.

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收藏 | 浏览/下载：118/0 | 提交时间：2020/03/31

He II population modelling tokamak plasmas spectral line intensity ratios

Step-by-step pipeline processing approach for line segment detection 期刊论文 OAI收割
IET Image Processing, 2017, 卷号: 11, 期号: 6, 页码: 416-424
作者: Zheng, Tianjiang; Chang Z(常铮); Luo HB(罗海波); Ding QH(丁庆海); Shao CY(邵春艳)

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收藏 | 浏览/下载：37/0 | 提交时间：2017/07/17

image segmentation affine transforms edge detection eigenvalues and eigenfunctions line segment detection step-by-step pipeline processing approach resistant to affine transformation and monotonic intensity change descriptor RATMIC descriptor Canny detector Harris corner detector regions of interest

Measurement of CO2 concentration at high-temperature based on tunable diode laser absorption spectroscopy 期刊论文 OAI收割
INFRARED PHYSICS & TECHNOLOGY, 2017, 卷号: 80, 期号: 无, 页码: 131-137
作者: Chen, Jiuying; Li, Chuanrong

收藏 | 浏览/下载：21/0 | 提交时间：2018/05/02

Tunable Diode Laser Absorption Spectroscopy Co2 Concentration Line Intensity High-temperature Spectrum

The SHER-HIAF ring lattice design 会议论文 OAI收割
Shanghai, May 12, 2013 - May 17, 2013
作者: Gao, X.; Yang, J.C.H.; Xia, J.W.; Chai, W.P.; Shi, J.

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收藏 | 浏览/下载：21/0 | 提交时间：2017/04/05

Accelerator Complex - Heavy-ion Accelerator - High Intensity - Lattice Design - Rare Isotope Beams - Secondary Nuclei - Time-of-flight Mass Spectrometers - Transport Line

Nanoscale patterns made by using a 13.5-nm Schwarzschild objective and a laser produced plasma source (EI CONFERENCE) 会议论文 OAI收割
Optical Micro- and Nanometrology IV, April 16, 2012 - April 18, 2012, Brussels, Belgium
作者: Wang X.; Wang X.; Wang X.; Wang Z.; Wang Z.

收藏 | 浏览/下载：37/0 | 提交时间：2013/03/25

Lithium fluoride (LiF) crystal is a very promising candidate as nanometer resolution EUV and soft X-ray detector. Compared with other EUV and soft X-ray detectors charge coupled device and photographic films LiF crystal has high resolution large field of view and wide dynamic range. In this paper using LiF crystal as EUV detector and a Schwarzschild objective (SO) working at 13.5nm as projection optics mesh images with 4.2 m 1.2 m and 800 nm line width and pinhole patterns with 1.5m diameter are acquired in projection imaging mode and direct writing mode respectively. Fluorescence intensity profiles of images show that the resolution of mesh image is 900 nm and the one of pinhole image is 800 nm. In the experiments a spherical condense mirror based on normal incidence type is used to eliminate the damage and contamination on the masks (mesh and pinhole) caused by the laser plasma and the energy density is not decreased compared with that the masks are close to the plasma. The development of the SO the alignment of the objective and the imaging experiments are also reported. 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).

Fabrication of high-efficiency ultraviolet blazed gratings by use of direct Ar2-CHF3 ion-beam etching through a rectangular photoresist mask (EI CONFERENCE) 会议论文 OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, May 24, 2011 - May 26, 2011, Beijing, China
Tan X.

收藏 | 浏览/下载：25/0 | 提交时间：2013/03/25

In ultraviolet spectroscopy groove irregularity and surface roughness of nanometer magnitude can cause a significant loss of diffraction efficiency. Therefore there is a constant need to improve the diffraction efficiency. A blazed grating can concentrate most of the light intensity into a desired diffraction order it is important to control the groove shape precisely so it is the optimum choice among gratings of different kinds of profile. As the operating wavelength of most UV spectral applications is less than 200 nm especially the blaze angle and the apical angle. We have presented a direct shaping method to fabricate EUV blazed gratings by using an ion-beam mixture of Ar+ and CHF2 +to etch K9 glass with a rectangular photoresist mask. With this method the required blaze angle is small we have succeeded in fabricating well-shaped UV blazed gratings with a 1200 line/mm groove density and 8.54 blaze angles and 1200 line/mm groove density and 11.68 blaze angles and the metrical efficiency is about 81% and 78%. The good performance of the gratings was verified by diffraction efficiency measurements. When one uses the etching model the conditions on the ion-beam grazing incident angle and the CHF3partial pressure should be noted. Besides since the etched groove shape depends on the aspect ratio of the photoresist mask ridge if we wish to fabricate larger gratings with this method we must improve the uniformity of the photoresist mask before ion-beam etching. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).

Architecture of a silicon strip beam position monitor 期刊论文 iSwitch采集
Journal of instrumentation, 2010, 卷号: 5, 页码: 8
作者: Angstadt, R.; Cooper, W.; Demarteau, M.; Green, J.; Jakubowski, S.

收藏 | 浏览/下载：31/0 | 提交时间：2019/04/23

Beam-line instrumentation (beam position and profile monitors Beam-intensity monitors Bunch length monitors) Analogue electronic circuits Data acquisition circuits Front-end electronics for detector readout