中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
长春光学精密机械与物... [1]
上海药物研究所 [1]
植物研究所 [1]
采集方式
OAI收割 [3]
内容类型
期刊论文 [2]
会议论文 [1]
发表日期
2020 [1]
2015 [1]
2011 [1]
学科主题
Biochemist... [1]
Evolutiona... [1]
Genetics &... [1]
筛选
浏览/检索结果:
共3条,第1-3条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
发表日期升序
发表日期降序
Covalent Inhibitors Allosterically Block the Activation of Rho Family Proteins and Suppress Cancer Cell Invasion
期刊论文
OAI收割
ADVANCED SCIENCE, 2020, 页码: 13
作者:
Sun, Zhongya
;
Zhang, Hao
;
Zhang, Yuanyuan
;
Liao, Liping
;
Zhou, Wen
  |  
收藏
  |  
浏览/下载:86/0
  |  
提交时间:2020/07/01
anti-metastasis activities
crystal structures
inhibitors
novel pockets
rho family proteins
An Arabidopsis Transcriptional Regulatory Map Reveals Distinct Functional and Evolutionary Features of Novel Transcription Factors
期刊论文
OAI收割
MOLECULAR BIOLOGY AND EVOLUTION, 2015, 卷号: 32, 期号: 7, 页码: 1767-1773
作者:
Jin, Jinpu
;
He, Kun
;
Tang, Xing
;
Li, Zhe
;
Lv, Le
  |  
收藏
  |  
浏览/下载:45/0
  |  
提交时间:2022/09/13
transcription factor
transcriptional regulation
network structure
novel family
wiring preference
Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE)
会议论文
OAI收割
MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011, Guilin, China
作者:
Li X.-Z.
;
Wang X.-J.
收藏
  |  
浏览/下载:38/0
  |  
提交时间:2013/03/25
A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper
we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case
we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values
the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore
we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.