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Response spectrum 0.9-2.65 m of In0.82Ga0.18As detectors by two-step growth technique (EI CONFERENCE) 会议论文  OAI收割
2012 International Conference on Material Sciences and Manufacturing Technology, ICMSMT 2012, October 5, 2012 - October 6, 2012, Dalian, China
作者:  
Zhang T.
收藏  |  浏览/下载:20/0  |  提交时间:2013/03/25
InP/In0.82Ga0.18As/InP heterostructure used for infrared detector were grown on (100) S-doped InP substrates using two-step growth technique by low temperature metal-organic chemical vapor deposition. The growth was performed using TMIn  TMGa  AsH3  and PH3 as growth precursors in a horizontal reactor. The substrates on a graphite susceptor were heated by inductively coupling RF power  their temperatures were detected by a thermocouple  and the reactor pressure was kept at 10000 Pa. The growth structure of detector included In0.82Ga0.18As buffer with the thickness of 100 nm  In0.82Ga0.18As absorption layer with the thickness of 2.8 m  and the InP cap with the thickness of 0.8 m. The planar type of p-i-n detector was fabricated by Zn diffusion. The properties of In0.82Ga0.18As detector were studied  the curves of the I-V characteristics  the range of response spectrum  and the detectivity (D*) were obtained. (2013) Trans Tech Publications  Switzerland.  
台面型InP/InGaAs PIN光伏探测器的p-InP低阻欧姆接触 期刊论文  OAI收割
红外与激光工程, 2011, 期号: 12
魏鹏; 朱耀明; 邓洪海; 唐恒敬; 李雪; 张永刚; 龚海梅
收藏  |  浏览/下载:31/0  |  提交时间:2012/04/13
A New Edge-Coupled Two-Terminal Double Heterojunction Phototransistor (ECTT-DHPT) and Its DC Characteristics 会议论文  OAI收割
ieee photonicsglobal at singapore, singapore, singapore, dec 08-11, 2008
Wang, LS; Zhao, LJ; Pan, JQ; Zhang, W; Wang, H; Liang, S; Zhu, HL; Wang, W
收藏  |  浏览/下载:31/0  |  提交时间:2010/03/09
Structural and electrical analysis of S+ ion bombarded p-InP(100) 期刊论文  OAI收割
Applied Surface Science, 2006, 卷号: 253, 期号: 3, 页码: 1356-1364
Zhao, Q.; Zhai, G. J.; Kwok, R. W. M.
收藏  |  浏览/下载:18/0  |  提交时间:2014/04/30