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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
国家空间科学中心 [1]
长春光学精密机械与物... [1]
上海微系统与信息技术... [1]
半导体研究所 [1]
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OAI收割 [4]
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会议论文 [2]
期刊论文 [2]
发表日期
2013 [1]
2011 [1]
2008 [1]
2006 [1]
学科主题
光电子学 [1]
空间技术 [1]
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Response spectrum 0.9-2.65 m of In0.82Ga0.18As detectors by two-step growth technique (EI CONFERENCE)
会议论文
OAI收割
2012 International Conference on Material Sciences and Manufacturing Technology, ICMSMT 2012, October 5, 2012 - October 6, 2012, Dalian, China
作者:
Zhang T.
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  |  
浏览/下载:20/0
  |  
提交时间:2013/03/25
InP/In0.82Ga0.18As/InP heterostructure used for infrared detector were grown on (100) S-doped InP substrates using two-step growth technique by low temperature metal-organic chemical vapor deposition. The growth was performed using TMIn
TMGa
AsH3
and PH3 as growth precursors in a horizontal reactor. The substrates on a graphite susceptor were heated by inductively coupling RF power
their temperatures were detected by a thermocouple
and the reactor pressure was kept at 10000 Pa. The growth structure of detector included In0.82Ga0.18As buffer with the thickness of 100 nm
In0.82Ga0.18As absorption layer with the thickness of 2.8 m
and the InP cap with the thickness of 0.8 m. The planar type of p-i-n detector was fabricated by Zn diffusion. The properties of In0.82Ga0.18As detector were studied
the curves of the I-V characteristics
the range of response spectrum
and the detectivity (D*) were obtained. (2013) Trans Tech Publications
Switzerland.
台面型InP/InGaAs PIN光伏探测器的p-InP低阻欧姆接触
期刊论文
OAI收割
红外与激光工程, 2011, 期号: 12
魏鹏
;
朱耀明
;
邓洪海
;
唐恒敬
;
李雪
;
张永刚
;
龚海梅
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  |  
浏览/下载:31/0
  |  
提交时间:2012/04/13
传输线模型(TLM)
p-InP
欧姆接触
比接触电阻
AES
A New Edge-Coupled Two-Terminal Double Heterojunction Phototransistor (ECTT-DHPT) and Its DC Characteristics
会议论文
OAI收割
ieee photonicsglobal at singapore, singapore, singapore, dec 08-11, 2008
Wang, LS
;
Zhao, LJ
;
Pan, JQ
;
Zhang, W
;
Wang, H
;
Liang, S
;
Zhu, HL
;
Wang, W
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  |  
浏览/下载:31/0
  |  
提交时间:2010/03/09
P-I-N/HBT
WAVE-GUIDE
INP/INGAAS
FREQUENCY
HBT
Structural and electrical analysis of S+ ion bombarded p-InP(100)
期刊论文
OAI收割
Applied Surface Science, 2006, 卷号: 253, 期号: 3, 页码: 1356-1364
Zhao, Q.
;
Zhai, G. J.
;
Kwok, R. W. M.
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  |  
浏览/下载:18/0
  |  
提交时间:2014/04/30
InP
ion beam bombardment
sulfur passivation
XPS
LEED
passivated inp(100)-(1x1) surface
ray photoelectron-spectroscopy
(nh4)2sx-treated gaas 100
p3n5 gate insulators
sulfide passivation
sulfur passivation
electronic states
sinx/inp interface
ab-initio
inp