机构

• 力学研究所 [1]
• 长春光学精密机械与物... [1]
• 重庆绿色智能技术研究... [1]
• 半导体研究所 [1]
• 兰州化学物理研究所 [1]

采集方式

• OAI收割 [5]

内容类型

• 期刊论文 [3]
• 会议论文 [2]

发表日期

• 2018 [1]
• 2012 [1]
• 2008 [1]
• 2007 [1]
• 2006 [1]

学科主题

• 光电子学 [1]
• 材料科学与物理化学 [1]

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Nondestructive Thickness Inspection of Capsule Coating by Terahertz Time-Domain Spectroscopy 期刊论文  OAI收割 IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, 2018, 卷号: 8, 期号: 6, 页码: 688-695 作者:  Chang, Tianying;  Guo, Qijia;  Liu, Lingyu;  Cui, Hong-Liang   |  收藏  |  浏览/下载：75/0  |  提交时间：2019/01/17 Capsule coating  matched filter (MF)  thickness determination  terahertz time-domain spectroscopy (THz-TDS)   New electromagnetic imaging tool introduced for corrosion detection 会议论文  OAI收割 2012 International Conference on Electrical Insulating Materials and Electrical Engineering, EIMEE 2012, Shenyang, Liaoning, China, MAY 25-27, 2012 作者:  Zhong XF(钟兴福);  Wu YX(吴应湘);  Chen JQ;  Abakumov A;  Zhong XF(钟兴福) 收藏  |  浏览/下载：26/0  |  提交时间：2013/02/26 Electrical engineering  Electromagnetism  Inspection  Insulating materials  Magnetic leakage  Oil fields  Brush structure  Casing damage  Casing wall  Corrosion detection  Corrosion inspection  Electromagnetic imaging  High resolution  Magnetic flux leakage  Metal loss  System structures  Thickness determination  Vertical profile   Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Yang H.;  Liu L.;  Liu L. 收藏  |  浏览/下载：28/0  |  提交时间：2013/03/25 Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.   Thickness determination of molecularly thin lubricant films by angle-dependent X-ray photoelectron spectroscopy 期刊论文  OAI收割 Applied Surface Science, 2007, 卷号: 253, 页码: 4688-4693 庞重军; 白明武 收藏  |  浏览/下载：30/0  |  提交时间：2013/11/01 Thickness determination  Metrology  Angle-dependent XPS  Lubricant  Perfluoropolyether   Comparison between double crystals X-ray diffraction micro-Raman measurement on composition determination of high Ge content Si1_xGex layer epitaxied on Si substrate 期刊论文  OAI收割 journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654 Zhao L (Zhao Lei); Zuo YH (Zuo Yuhua); Cheng BW (Cheng Buwen); Yu JZ (Yu Jinzhong); Wang QM (Wang Qiming) 收藏  |  浏览/下载：44/0  |  提交时间：2010/04/11 Si1_xGex  Ge content  composition determination  double crystals X-ray diffraction (DCXRD)  micro-Raman measurement  BAND-GAP  HETEROSTRUCTURES  SUPERLATTICES  ALLOYS  RELAXATION  SCATTERING  THICKNESS  STRAIN