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浏览/检索结果: 共7条,第1-7条 帮助

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Probabilistic analysis of a sustainable landfill cover considering stress-dependent water retention model and copula-based random fields 期刊论文  OAI收割
ENGINEERING GEOLOGY, 2024, 卷号: 332, 页码: 18
作者:  
Ng, Charles W. W.;  Qu, Chuanxiang;  Guo, Haowen;  Chen, Rui;  Xue, Qiang
  |  收藏  |  浏览/下载:1/0  |  提交时间:2025/06/27
Micron-Thick Interlocked Carbon Nanotube Films with Excellent Impact Resistance via Micro-Ballistic Impact 期刊论文  OAI收割
SMALL, 2023
作者:  
Xiao KL(肖凯璐);  Zhang, Pengfei;  Hu, Dongmei;  Huang, Chenguang;  Wu XQ(吴先前)
  |  收藏  |  浏览/下载:27/0  |  提交时间:2023/06/15
Effect of plasticity on the coefficient of restitution of an elastoplastic sphere impacting an elastic plate 期刊论文  OAI收割
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 2021, 卷号: 222, 页码: 11
作者:  
Peng Q(彭青);  Jin, Y.;  Liu XM(刘小明);  Wei YG(魏悦广)
  |  收藏  |  浏览/下载:37/0  |  提交时间:2021/08/03
Solution Processable CrN Thin Films: Thickness-Dependent Electrical Transport Properties 期刊论文  OAI收割
MATERIALS, 2020, 卷号: 13
作者:  
Hui, Zhenzhen;  Zuo, Xuzhong;  Ye, Longqiang;  Wang, Xuchun;  Zhu, Xuebin
  |  收藏  |  浏览/下载:43/0  |  提交时间:2020/11/26
Exploring the sensitivity of alpha-decay half-life to neutron skin thickness for nuclei around Pb-208 期刊论文  OAI收割
NUCLEAR SCIENCE AND TECHNIQUES, 2017, 卷号: 28, 页码: 5
作者:  
Wan, Niu;  Xu, Chang;  Ren, Zhong-Zhou
  |  收藏  |  浏览/下载:26/0  |  提交时间:2018/05/31
Thickness determination of molecularly thin lubricant films by angle-dependent X-ray photoelectron spectroscopy 期刊论文  OAI收割
Applied Surface Science, 2007, 卷号: 253, 页码: 4688-4693
庞重军; 白明武
收藏  |  浏览/下载:33/0  |  提交时间:2013/11/01
Effect of interface on luminescence properties in ZnO/MgZnO heterostructures (EI CONFERENCE) 会议论文  OAI收割
Wei Z. P.; Lu Y. M.; Shen D. Z.; Wu C. X.; Zhang Z. Z.; Zhao D. X.; Zhang J. Y.; Fan X. W.
收藏  |  浏览/下载:31/0  |  提交时间:2013/03/25
A set of ZnO/MgZnO heterostructures with well widths  Lw  varying from 2 to 20 nm has been grown by plasma-assisted molecular-beam epitaxy (P-MBE). We present a room-temperature (RT) study of the well-width-dependent photoluminescence (PL) spectra and carrier lifetimes in ZnO/MgZnO heterostructures. Bi-exponential process is seen at RT time-decay curves of the luminescence from the well layers. The fast process is from the recombination of the free exciton  while the slow process is attributing to the recombination of the localized exciton in the interface of ZnO and MgZnO. It is also confirmed from the PL peak shift of time-resolved PL spectra. With decreasing the well thickness  the fast process gradually increases and dominantly contributes to the PL spectrum due to the interface improvement. 2006 Elsevier B.V. All rights reserved.