中国科学院机构知识库网格
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Controlled Growth of Wafer-Scale Transition Metal Dichalcogenides with a Vertical Composition Gradient for Artificial Synapses with High Linearity 期刊论文  OAI收割
ACS NANO, 2022, 卷号: 16, 期号: 8, 页码: 12318-12327
作者:  
Tang, Lei;  Teng, Changjiu
  |  收藏  |  浏览/下载:37/0  |  提交时间:2022/10/08
Patterning of Wafer-Scale MXene Films for High-Performance Image Sensor Arrays 期刊论文  OAI收割
ADVANCED MATERIALS, 2022, 页码: 8
作者:  
Li, Bo;  Zhu, Qian-Bing;  Cui, Cong;  Liu, Chi;  Wang, Zuo-Hua
  |  收藏  |  浏览/下载:47/0  |  提交时间:2022/07/01
Growth of wrinkle-free and ultra-flat Bi-layer graphene on sapphire substrate using Cu sacrificial layer 期刊论文  OAI收割
NANOTECHNOLOGY, 2021, 卷号: 32, 期号: 47
作者:  
Lou, Gang;  Ouyang, Yi;  Xie, Ying;  Wang, Wei;  Liu, Zhaoping
  |  收藏  |  浏览/下载:16/0  |  提交时间:2021/12/01
A scalable polymer-free method for transferring graphene onto arbitrary surfaces 期刊论文  OAI收割
CARBON, 2020, 卷号: 161, 页码: 479-485
作者:  
Zhang, Xuewei;  Xu, Chen;  Zou, Zhenxing;  Wu, Zehao;  Yin, Shaoqian
  |  收藏  |  浏览/下载:102/0  |  提交时间:2020/12/16
25th Anniversary Article: Carbon Nanotube- and Graphene- Based Transparent Conductive Films for Optoelectronic Devices 期刊论文  OAI收割
Advanced Materials, 2014, 卷号: 26, 期号: 13, 页码: 1958-1991
J. H. Du; S. F. Pei; L. P. Ma; H. M. Cheng
收藏  |  浏览/下载:59/0  |  提交时间:2014/07/03
Layer-Controlled and Wafer-Scale Synthesis of Uniform and High-Quality Graphene Films on a Polycrystalline Nickel Catalyst 期刊论文  OAI收割
Advanced Functional Materials, 2012, 卷号: 22, 期号: 15, 页码: 3153–3159
作者:  
Weiwei Li(李伟伟);  Weiwei Li(李伟伟);  Liwei Liu(刘立伟);  Liwei Liu(刘立伟);  Liwei Liu(刘立伟)
收藏  |  浏览/下载:19/0  |  提交时间:2013/01/14
Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE) 会议论文  OAI收割
MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011, Guilin, China
作者:  
Li X.-Z.;  Wang X.-J.
收藏  |  浏览/下载:35/0  |  提交时间:2013/03/25
A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper  we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case  we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values  the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore  we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.  
Preparation of Quasi-Free-Standing Graphene with a Super Large Interlayer Distance by Methane Intercalation 期刊论文  OAI收割
JOURNAL OF PHYSICAL CHEMISTRY C, 2011, 卷号: 115, 期号: 42, 页码: 20538
Huang, Q; Chen, XL; Lin, JJ; Li, K; Jia, YP; Liu, J; Guo, LW; Wang, WJ; Wang, G
收藏  |  浏览/下载:22/0  |  提交时间:2013/09/24