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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
金属研究所 [5]
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OAI收割 [5]
内容类型
期刊论文 [5]
发表日期
2018 [3]
2017 [2]
学科主题
Materials ... [3]
Metallurgy... [3]
Chemistry,... [1]
Nanoscienc... [1]
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Breaking the trade-off relation of strength and electrical conductivity in pure Al wire by controlling texture and grain boundary
期刊论文
OAI收割
JOURNAL OF ALLOYS AND COMPOUNDS, 2018, 卷号: 769, 页码: 96-109
作者:
Hou, JP
;
Li, R
;
Wang, Q
;
Yu, HY
;
Zhang, ZJ
  |  
收藏
  |  
浏览/下载:43/0
  |  
提交时间:2018/12/25
Al wire
Cold drawing
Texture
Yield strength
Electrical conductivity
Breaking the trade-off relation of strength and electrical conductivity in pure Al wire by controlling texture and grain boundary
期刊论文
OAI收割
JOURNAL OF ALLOYS AND COMPOUNDS, 2018, 卷号: 769, 页码: 96-109
作者:
Hou, J. P.
;
Li, R.
;
Wang, Q.
;
Yu, H. Y.
;
Zhang, Z. J.
  |  
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2021/02/02
Al wire
Cold drawing
Texture
Yield strength
Electrical conductivity
Breaking the trade-off relation of strength and electrical conductivity in pure Al wire by controlling texture and grain boundary
期刊论文
OAI收割
JOURNAL OF ALLOYS AND COMPOUNDS, 2018, 卷号: 769, 页码: 96-109
作者:
Hou, J. P.
;
Li, R.
;
Wang, Q.
;
Yu, H. Y.
;
Zhang, Z. J.
  |  
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2021/02/02
Al wire
Cold drawing
Texture
Yield strength
Electrical conductivity
Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor
期刊论文
OAI收割
ELSEVIER SCIENCE SA, 2017, 卷号: 707, 页码: 511-517
作者:
Hou, J. P.
;
Chen, Q. Y.
;
Wang, Q.
;
Yu, H. Y.
;
Zhang, Z. J.
  |  
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2018/01/10
CommerciAlly Pure Al Conductor
Strength
Annealing Treatment
Texture Evolution
Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires
期刊论文
OAI收割
JOURNAL MATER SCI TECHNOL, 2017, 卷号: 33, 期号: 9, 页码: 1039-1043
作者:
Luo, X. M.
;
Song, Z. M.
;
Li, M. L.
;
Wang, Q.
;
Zhang, G. P.
  |  
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2018/01/10
Cold Drawing
Aluminum
Microstructure
Strength
Conductivity