中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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  • 2016 [2]
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Topography measurement of micro structure by modulation-based method 期刊论文  OAI收割
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968505
作者:  
Zhou, Yi;  Tang, Yan;  Liu, Junbo;  Deng, Qinyuan
  |  收藏  |  浏览/下载:19/0  |  提交时间:2018/06/14
Two dimensional surface slope metrology with enhanced spatial resolution based on wavefront coding method 期刊论文  OAI收割
8TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: SUBNANOMETER ACCURACY MEASUREMENT FOR SYNCHROTRON OPTICS AND X-RAY OPTICS, 2016, 卷号: 9687, 页码: -
作者:  
Zhang, XW;  Li, M;  Li M(李明);  Yang, FG;  Zhang XW(张晓伟)
  |  收藏  |  浏览/下载:17/0  |  提交时间:2017/07/24